We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£60.59
Information Science Reference Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Price data checked 5 days ago
Price History & Forecast
Last 86 days • 86 data points (No recent data available)
Price Distribution
Price distribution over 86 days • 5 price levels
Price Analysis
Most common price: £60 (26 days, 30.2%)
Price range: £55 - £62
Price levels: 5 different prices over 86 days
Description
Product Specifications
- Format
- hardcover
- ASIN
- 1609602129
- Domain
- Amazon UK
- Release Date
- 31 March 2011
- Listed Since
- 17 May 2010
Barcode
No barcode data available
Similar Products You Might Like
Reliability, Availability and Serviceability of Networks-on-Chip
Springer
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
VLSI Design and Test for Systems Dependability
Springer
VLSI Design and Test for Systems Dependability
Springer
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)
Morgan Kaufmann
Springer Introduction to Advanced SoC Test Design and Optimization
Springer
Wiley Digital Logic Testing and Simulation - Engineering Book
Wiley
CTL for Test Information of Digital ICs
Springer
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
CRC Press
Essential Issues in SOC Design: Designing Complex Systems-on-Chip
Springer
The Chip Is the Network (Foundations and Trends (R) in Electronic Design Automation): Towards a Science of Network-on-Chip Design
Electronic Design Automation for IC System Design, Verification, and Testing
CRC Press
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits: 19 (Devices, Circuits, and Systems)
CRC Press
Dependability and Computer Engineering: Concepts for Software-Intensive Systems
Information Science Reference
Semiconductor Memories: Technology, Testing, and Reliability
Wiley
Enabling the Internet of Things: From Integrated Circuits to Integrated Systems
Springer
Digital System Test and Testable Design: Using HDL Models and Architectures
Springer
System-level Test and Validation of Hardware/Software Systems: 17 (Springer Series in Advanced Microelectronics, 17)
Springer
Integrated Circuit Quality and Reliability (Electrical and Computer Engineering)
CRC Press
Digital Microfluidic Biochips: Synthesis, Testing, and Reconfiguration Techniques
CRC Press
Design of System on a Chip: Devices & Components
Springer
Design and Analysis of Reliable and Fault Tolerant Computer Systems
Imperial College Press
Integrated Circuit Failure Analysis: A Guide to Preparation Techniques (Quality and Reliability Engineering Series)
Wiley