We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£60.59
Information Science Reference Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Price data last checked 43 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 2 months ago.
£61 today · all-time low £60 (Mar 2026) · usually the usual
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 48 days • 48 data points (No recent data available)
Price Distribution
Price distribution over 48 days • 3 price levels
Price Analysis
Most common price: £61 (30 days, 62.5%)
Price range: £60 - £62
Price levels: 3 different prices over 48 days
Description
Product Specifications
- Format
- hardcover
- ASIN
- 1609602129
- Domain
- Amazon UK
- Release Date
- 31 March 2011
- Listed Since
- 17 May 2010
Barcode
No barcode data available
Similar Products You Might Like
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
Springer Design for AT-Speed Test, Diagnosis and Measurement
Springer
Springer Introduction to Advanced SoC Test Design and Optimization
Springer
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)
Morgan Kaufmann
Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
Springer
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
Springer
IEEE International Test Conference 2001
Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing, 29)
Springer
Practical Fault Finding in Electronic Devices
LAP Lambert Academic Publishing
CTL for Test Information of Digital ICs
Springer
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)
Springer
Architecture Design for Soft Errors
Morgan Kaufmann
Testing Chips with Mesh-Based Network-on-Chip
LAP Lambert Academic Publishing
Testing of Interposer-Based 2.5D Integrated Circuits
Springer
Testing Active and Passive Electronic Components: 38 (Electrical and Computer Engineering)
CRC Press
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
CRC Press
Integrated Circuit Test Engineering: Modern Techniques
Springer
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
CRC Press
Large Scale Computations, Embedded Systems and Computer Security
Wiley Embedded Systems: Hardware, Design and Implementation
Wiley
Guidebook for Managing Silicon Chip Reliability: 5 (Electronic Packaging)
CRC Press
Soft Errors in Modern Electronic Systems: 41 (Frontiers in Electronic Testing, 41)
Springer