£139.95

Wiley Principles of Testing Electronic Systems (Wiley-Interscience)

Price data checked 6 days ago

View at Amazon

We'll watch every seller, every day. One email when your price arrives.

It has never been this cheap. We have no record of a lower price.

£140 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey
↓ Forecast
where the price is heading next
↓ Statistics
all-time high & low, recent range
↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 85 days · 85 data points (no recent data)

Historical
Generating forecast…
£139.95 £132.95 £135.75 £138.55 £141.35 £144.15 £146.95 10 June 2026 01 July 2026 22 July 2026 12 August 2026 02 September 2026

Price Distribution

Price distribution over 85 days • 1 price levels

Days at Price
85 days 0 21 43 64 85 £140 Days at Price

Price Analysis

Most common price: £140 (85 days, 100.0%)

Price range: £140 - £140

Price levels: 1 different prices over 85 days

Description

A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Product Specifications

Brand
Wiley
Format
hardcover
Domain
Amazon UK
Release Date
15 August 2000
Listed Since
09 February 2007

Barcode

No barcode data available

Similar Products You Might Like

Wiley Digital Logic Testing and Simulation - Engineering Book
97% match

Wiley Digital Logic Testing and Simulation - Engineering Book

Wiley

£131.99 03 Aug 2026
CTL for Test Information of Digital ICs
96% match

CTL for Test Information of Digital ICs

Springer

£53.79 07 Jul 2026
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
96% match

Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI

Springer

£136.54 17 Jul 2026
Integrated Circuit Test Engineering: Modern Techniques
96% match

Integrated Circuit Test Engineering: Modern Techniques

Springer

£45.85 15 Aug 2026
Wiley-IEEE Press Digital Systems Testing and Testable Design
96% match

Wiley-IEEE Press Digital Systems Testing and Testable Design

Wiley-IEEE Press

£71.22 20 Jul 2026
Random Testing of Digital Circuits: Theory and Applications
96% match

Random Testing of Digital Circuits: Theory and Applications

CRC Press

£162.42 24 Aug 2026
Embedded Processor-Based Self-Test: 28 (Frontiers in Electronic Testing, 28)
96% match

Embedded Processor-Based Self-Test: 28 (Frontiers in Electronic Testing, 28)

Springer

£110.07 17 Jul 2026
Springer - Design to Test: Electronic Design and Manufacture
96% match

Springer - Design to Test: Electronic Design and Manufacture

Springer

£41.40 03 Jul 2026
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
96% match

Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow

CRC Press

£16.49 12 Aug 2026
Power-Aware Testing and Test Strategies for Low Power Devices
96% match

Power-Aware Testing and Test Strategies for Low Power Devices

Springer

£80.66 07 Jul 2026
Post-Silicon and Runtime Verification for Modern Processors
96% match

Post-Silicon and Runtime Verification for Modern Processors

Springer

£106.78 13 Jul 2026
Robustness and Usability in Modern Design Flows
96% match

Robustness and Usability in Modern Design Flows

Springer

£74.01 09 Jul 2026
On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)
96% match

On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)

Springer

£75.36 27 Jul 2026
Counterfeit Integrated Circuits: Detection and Avoidance
96% match

Counterfeit Integrated Circuits: Detection and Avoidance

Springer

£72.88 08 Jul 2026
Springer Introduction to Advanced SoC Test Design and Optimization
96% match

Springer Introduction to Advanced SoC Test Design and Optimization

Springer

£121.67 18 Jul 2026
Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
96% match

Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)

Springer

£91.93 11 Aug 2026
Probabilistische Verfahren für den Test hochintegrierter Schaltungen: 140 (Informatik-Fachberichte, 140)
96% match

Probabilistische Verfahren für den Test hochintegrierter Schaltungen: 140 (Informatik-Fachberichte, 140)

Springer

£46.99 08 Jul 2026
High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)
96% match

High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)

Artech House

£74.60 06 Jul 2026
A Designer’s Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19)
96% match

A Designer’s Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19)

Springer

£164.01 03 Sep 2026
Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
96% match

Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)

Information Science Reference

£178.98 22 Jul 2026
Testing of Interposer-Based 2.5D Integrated Circuits
96% match

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

£72.09 07 Jul 2026
Principles of Verifiable RTL Design: A functional coding style supporting verification processes in Verilog
96% match

Principles of Verifiable RTL Design: A functional coding style supporting verification processes in Verilog

Springer

£74.65 09 Jul 2026
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32)
96% match

Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32)

Springer

£108.00 18 Jul 2026
Testing Chips with Mesh-Based Network-on-Chip
95% match

Testing Chips with Mesh-Based Network-on-Chip

LAP Lambert Academic Publishing

£61.00 17 Jul 2026