We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£129.88
Springer Introduction to Advanced SoC Test Design and Optimization
Price data last checked 47 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£130 today · previous high £130 · all-time low £125
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 44 days • 44 data points (No recent data available)
Price Distribution
Price distribution over 44 days • 2 price levels
Price Analysis
Most common price: £125 (38 days, 86.4%)
Price range: £125 - £130
Price levels: 2 different prices over 44 days
Description
Key Features
Comprehensive coverage of SOC test design and optimization techniques to improve semiconductor reliability.
Structured learning through three distinct sections covering test concepts, design for test, and practical applications.
Detailed technical analysis of fault types and design-flow processes essential for electronic testing.
In-depth discussion on implementing testing methodologies into electronic design automation (EDA) tools.
Exploration of industry-standard design-for-test techniques including scan-testing and Boundary Scan.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1402032072
- Domain
- Amazon UK
- Release Date
- 07 November 2005
- Listed Since
- 04 January 2007
Barcode
No barcode data available
Similar Products You Might Like
Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing, 29)
Springer
CTL for Test Information of Digital ICs
Springer
Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Information Science Reference
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
Springer
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
Integrated Circuit Test Engineering: Modern Techniques
Springer
Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
Springer
Springer Design for AT-Speed Test, Diagnosis and Measurement
Springer
SoC Physical Design: A Comprehensive Guide
Springer
On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)
Springer
The Simple Art of SoC Design: Closing the Gap between RTL and ESL
Springer
High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)
Artech House
Soft Errors in Modern Electronic Systems: 41 (Frontiers in Electronic Testing, 41)
Springer
SystemVerilog for Verification: A Guide to Learning the Testbench Language Features
Springer
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
CRC Press
Testing Chips with Mesh-Based Network-on-Chip
LAP Lambert Academic Publishing
Essential Issues in SOC Design: Designing Complex Systems-on-Chip
Springer
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits: 19 (Devices, Circuits, and Systems)
CRC Press
Springer - Microelectronic Test Structures for CMOS Technology
Springer
Wiley Digital Logic Testing and Simulation - Engineering Book
Wiley
System on Chip Interfaces for Low Power Design
Morgan Kaufmann
SystemVerilog for Verification: A Guide to Learning the Testbench Language Features
Springer
A Practical Approach to VLSI System on Chip (SoC) Design: A Comprehensive Guide
Springer