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Springer Introduction to Advanced System-on-Chip Test Design - Springer

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Description

Introduction to Advanced System-on-Chip Test Design and Optimization is a comprehensive guide to SOC test design methodologies and optimization techniques. This volume in the Frontiers in Electronic Testing series explores the critical challenges of testing modern system-on-chip devices and provides practical solutions for integrating test concepts into electronic design automation tools. The book is organised into three key sections covering test concepts, SOC design for test, and SOC test applications. The opening section introduces fundamental testing principles, examines various fault types, and details the design flow alongside essential design-for-test techniques including scan testing and Boundary Scan methods. This structured approach equips engineers and designers with the knowledge needed to implement effective testing strategies and optimise test performance in complex semiconductor systems.

Key Features

Introduction to Advanced System-on-Chip Test Design covers modelling granularity and implementation into electronic design automation tools.

The book explores test concepts, SOC design for test, and SOC test applications across three comprehensive sections.

Detailed coverage of design-for-test techniques including scan testing and Boundary Scan methods for SOC devices.

Part of the Frontiers in Electronic Testing series (volume 29) providing industry-standard knowledge on SOC test design.

Addresses fault types and design-flow principles essential for understanding modern system-on-chip testing challenges.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
07 November 2005
Listed Since
04 January 2007

Barcode

No barcode data available

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