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Springer Microelectronic Test Structures for CMOS Technology

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Description

Microelectronic Test Structures for CMOS Technology and Products provides essential insights into the design of test structures for CMOS products, scribe-lines, and test-vehicles. As the cost and complexity of manufacturing and development increase, the role of these structures in monitoring and developing CMOS technologies becomes more significant. Written by IBM scientists Manjul Bhushan and Mark Ketchen, this volume focuses on high speed characterization techniques for digital CMOS circuit applications. The text helps bridge the gap between circuit performance and development needs, offering a timely resource for those working in microelectronic engineering and technology.

Key Features

This Springer publication covers the basic concepts of designing test structures for CMOS products and scribe-lines.

IBM scientists Manjul Bhushan and Mark Ketchen provide expert perspectives on high speed characterization techniques.

The text addresses the growing importance of test structures in managing the complexity of CMOS manufacturing.

Content focuses on bridging the connection between circuit performance and digital CMOS circuit applications.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 August 2011
Listed Since
07 January 2011

Barcode

No barcode data available

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