Springer - Microelectronic Test Structures for CMOS Technology

Microelectronic Test Structures for CMOS Technology and Products provides a detailed look at the design of test structures used in test-vehicles, scribe-lines, and CMOS products. As the cost and complexity of manufacturing and development continue to rise, the role of these structures in monitoring and developing CMOS technologies has become more significant. Written by IBM scientists Manjul Bhushan and Mark Ketchen, this volume focuses on high speed characterization techniques specifically for digital CMOS circuit applications. It addresses the essential concepts needed to bridge the gap between design and practical implementation. This book serves as a professional resource for understanding how to incorporate effective test structures into modern microelectronic processes to ensure product reliability and performance.