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£122.61
Springer - Microelectronic Test Structures for CMOS Technology
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Description
Key Features
Covers basic concepts for designing test structures for incorporation within test-vehicles and scribe-lines.
Addresses the growing need for effective monitoring in CMOS technology development and manufacturing.
Focuses on high speed characterization techniques designed for digital CMOS circuit applications.
Provides expert insights from IBM scientists Manjul Bhushan and Mark Ketchen.
Explains the integration of test structures within CMOS products to manage increased development complexity.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1441993762
- Domain
- Amazon UK
- Release Date
- 30 August 2011
- Listed Since
- 07 January 2011
Barcode
No barcode data available
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