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Springer - Microelectronic Test Structures for CMOS Technology

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Description

Microelectronic Test Structures for CMOS Technology and Products provides a detailed look at the design of test structures used in test-vehicles, scribe-lines, and CMOS products. As the cost and complexity of manufacturing and development continue to rise, the role of these structures in monitoring and developing CMOS technologies has become more significant. Written by IBM scientists Manjul Bhushan and Mark Ketchen, this volume focuses on high speed characterization techniques specifically for digital CMOS circuit applications. It addresses the essential concepts needed to bridge the gap between design and practical implementation. This book serves as a professional resource for understanding how to incorporate effective test structures into modern microelectronic processes to ensure product reliability and performance.

Key Features

Covers basic concepts for designing test structures for incorporation within test-vehicles and scribe-lines.

Addresses the growing need for effective monitoring in CMOS technology development and manufacturing.

Focuses on high speed characterization techniques designed for digital CMOS circuit applications.

Provides expert insights from IBM scientists Manjul Bhushan and Mark Ketchen.

Explains the integration of test structures within CMOS products to manage increased development complexity.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 August 2011
Listed Since
07 January 2011

Barcode

No barcode data available

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