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£129.99
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£130 today · cheaper than every other day in the last 3 months
Springer Bias Temperature Instability for Devices and Circuits - Springer
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Price range: £130 - £130
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Description
Key Features
Covers negative bias temperature instability as a single-source reference for semiconductor reliability challenges.
Includes advanced research on time dependent defect spectroscopy and anomalous defect behaviour in semiconductor devices.
Presents stochastic modelling approaches with additional metastable states for accurate defect characterisation.
Explains multiphonon theory and compact modelling techniques using RC ladders for practical device applications.
Addresses device reliability and lifetime implications essential for semiconductor circuit design and manufacturing.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1461479088
- Domain
- Amazon UK
- Release Date
- 23 October 2013
- Listed Since
- 27 April 2013
Barcode
No barcode data available
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