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£129.99
Springer - Bias Temperature Instability for Devices and Circuits
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Description
Key Features
Provides a single-source reference for negative bias temperature instability research in modern semiconductor technologies.
Covers advanced topics including time dependent defect spectroscopy and anomalous defect behavior.
Includes detailed information on stochastic modeling with additional metastable states.
Explores multiphonon theory and compact modeling techniques using RC ladders.
Offers technical insights into the direct implications for device reliability and lifetime.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1461479088
- Domain
- Amazon UK
- Release Date
- 23 October 2013
- Listed Since
- 27 April 2013
Barcode
No barcode data available
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