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£117.84
Springer - CMOS Test and Evaluation: A Physical Perspective
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Description
Key Features
Provides an integrated view of test and data analysis methodology specifically for CMOS products.
Covers circuit sensitivities to MOSFET characteristics and silicon technology process variability.
Explains the applications of embedded test structures and sensors for better product monitoring.
Details essential information regarding product yield and reliability over the product lifetime.
Includes statistical data analysis and visualization techniques for improved technical insights.
Examines product behavior across a full range of voltage, temperature, and frequency.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1493913484
- Domain
- Amazon UK
- Release Date
- 04 December 2014
- Listed Since
- 27 May 2014
Barcode
No barcode data available
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