We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£124.98
Springer - CMOS Test and Evaluation: A Physical Perspective
Price data last checked 9 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£125 today · previous high £125 · all-time low £118
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 82 days · 82 data points (no recent data)
Price Distribution
Price distribution over 82 days • 2 price levels
Price Analysis
Most common price: £125 (53 days, 64.6%)
Price range: £118 - £125
Price levels: 2 different prices over 82 days
Description
Key Features
Provides an integrated view of test and data analysis methodology specifically for CMOS products.
Covers circuit sensitivities to MOSFET characteristics and silicon technology process variability.
Explains the applications of embedded test structures and sensors for better product monitoring.
Details essential information regarding product yield and reliability over the product lifetime.
Includes statistical data analysis and visualization techniques for improved technical insights.
Examines product behavior across a full range of voltage, temperature, and frequency.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 1493913484
- Domain
- Amazon UK
- Release Date
- 04 December 2014
- Listed Since
- 27 May 2014
Barcode
No barcode data available
Similar Products You Might Like
CMOS Test and Evaluation: A Physical Perspective
Springer
Springer - Microelectronic Test Structures for CMOS Technology
Springer
Wiley System Integration: Transistor Design to IC Circuits
Wiley
CMOS Logic Circuit Design
Springer
Springer Digital Timing Macromodeling for VLSI Design Verification
Springer
MOSFET Modeling & BSIM3 User’s Guide
Springer
Selected Semiconductor Research by Ming-Fu Li
Imperial College Press
MOS Devices for Low-Voltage and Low-Energy Applications (IEEE Press)
Wiley
Springer Statistical Modeling for MOS VLSI Circuits Book
Springer
Frontiers In Electronics: Advanced Modeling Of Nanoscale Electron Devices: 54 (Selected Topics in Electronics and Systems)
World Scientific Publishing Company
Wiley-IEEE Press CMOS Electronics: How It Works, How It Fails
Wiley-IEEE Press
Circuits at the Nanoscale: Communications, Imaging, and Sensing (Devices, Circuits, and Systems)
CRC Press
Fundamentals Of Nanotransistors: 6 (Lessons from Nanoscience: A Lecture Notes Series)
World Scientific Publishing Company
MOSFET MODELING FOR VLSI SIMULATION: THEORY AND PRACTICE: 0 (International Series On Advances In Solid State Electronics And Technology)
World Scientific Publishing Company
MOSFET Models for SPICE Simulation: Including BSIM3v3 and BSIM4 (IEEE Press)
Wiley-IEEE Press
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer
Springer - Bias Temperature Instability for Devices and Circuits
Springer
Charge-Based MOS Transistor Modeling: The EKV Model for Low-Power and RF IC Design
Wiley
CRC Press Microelectronics (Electronics Handbook Series) Book
CRC Press
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer
Springer Introduction to VLSI Silicon Devices Textbook
Springer
/uploads/images/products/2/B00S0YLJ0I/71ef5c75-b178-4007-9c52-fe74d31b2afd.webp
Springer
CMOS: Circuit Design, Layout, and Simulation (IEEE Press Series on Microelectronic Systems)
Wiley-IEEE Press
Springer Handbook of Semiconductor Devices
Springer