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Springer CMOS Test and Evaluation: A Physical Perspective - Springer

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Description

CMOS Test and Evaluation: A Physical Perspective is a comprehensive reference for engineers and technical professionals seeking a unified approach to testing and analysing CMOS products. This single-source guide integrates essential methodologies covering circuit sensitivities to MOSFET characteristics, silicon technology process variability, embedded test structures and sensors, product yield analysis, and lifetime reliability assessment. The book addresses statistical data analysis and visualisation techniques, test equipment specifications, and CMOS product behaviour across the full voltage, temperature and frequency range, making it indispensable for anyone involved in semiconductor testing, validation or quality assurance.

Key Features

CMOS Test and Evaluation provides integrated coverage of MOSFET characteristics and their impact on circuit performance and product reliability.

Springer's reference examines silicon technology process variability and its effects on yield, enabling better understanding of manufacturing challenges.

The book covers embedded test structures and sensors used in CMOS product development and validation throughout the product lifecycle.

Statistical data analysis and visualisation techniques are explained to support effective test data interpretation and product assessment.

CMOS product specifications and test equipment requirements are detailed to guide proper testing protocols and measurements.

Full voltage, temperature and frequency range behaviour analysis helps predict product performance across all operating conditions.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
04 December 2014
Listed Since
27 May 2014

Barcode

No barcode data available

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