£83.16

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£83 today · all-time low £82 (Sep 2026) · usually £82

Springer Statistical Modeling for MOS VLSI Circuits - Springer

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Description

Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits is a comprehensive resource for integrated circuit designers working with process variations and yield optimization. As MOS devices scale to meet demanding specifications, statistical techniques become essential for reliable circuit performance. This Springer publication covers statistical circuit simulation and optimization environments tailored for VLSI designers, providing the foundational CAD tools and methodologies needed to perform accurate statistical analysis. The book addresses the critical challenge of designing integrated circuits that maintain maximum yield despite manufacturing variability, offering practical approaches to statistical circuit design that help engineers navigate the complexities of modern semiconductor development and ensure their designs remain robust across process variations.

Key Features

Focuses on statistical circuit simulation and optimization techniques for MOS VLSI designers.

Addresses process variations and their impact on integrated circuit reliability and yield.

Part of the Springer International Series in Engineering and Computer Science volume 211.

Provides CAD tool methodologies for accurate statistical analysis in circuit design.

Covers statistical modeling approaches for designing circuits that maintain performance across manufacturing variations.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
27 September 2012
Listed Since
14 July 2013

Barcode

No barcode data available

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