£76.00

Springer Statistical Modeling for MOS VLSI Circuits Book

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Description

As MOS devices scale to meet demanding circuit specifications, process variations impact the reliability of circuit performance. This technical resource from Springer addresses the need for statistical techniques to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits provides a statistical circuit simulation and optimization environment tailored for VLSI circuit designers. The text focuses on the essential development of accurate CAD tools capable of performing statistical simulation, which is the first step toward successful statistical circuit design and optimization. This book serves as a specialized guide for engineers and researchers working within the Springer International Series in Engineering and Computer Science to navigate the complexities of modern circuit design.

Key Features

Addresses the impact of process variations on MOS device reliability and performance.

Provides a statistical circuit simulation and optimization environment for VLSI designers.

Explains the development of accurate CAD tools for statistical circuit simulation.

Focuses on techniques to design integrated circuits with maximum yield.

Part of the Springer International Series in Engineering and Computer Science.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
27 September 2012
Listed Since
14 July 2013

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No barcode data available

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