Springer VLSI Design for Manufacturing: Yield Enhancement

Success in the integrated circuit industry depends on bringing new products to market quickly and ensuring production yields are high enough to remain profitable. This technical volume from Springer addresses these challenges by exploring the two primary methods for increasing yield: improving manufacturing process control and implementing design strategies that minimize the impact of inherent process variations on circuit performance. As device sizes continue to shrink, the effects of fluctuations during IC fabrication become more significant. This book focuses on the methodologies known as design for manufacture or statistical design. By understanding how to design processes and circuits to account for these variations, engineers can better manage performance and reliability in modern semiconductor manufacturing. This text is a specialized resource for those working within the Springer International Series in Engineering and Computer Science.