£113.94

Springer VLSI Design for Manufacturing: Yield Enhancement

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Description

Success in the integrated circuit industry depends on bringing new products to market quickly and ensuring production yields are high enough to remain profitable. This technical volume from Springer addresses these challenges by exploring the two primary methods for increasing yield: improving manufacturing process control and implementing design strategies that minimize the impact of inherent process variations on circuit performance. As device sizes continue to shrink, the effects of fluctuations during IC fabrication become more significant. This book focuses on the methodologies known as design for manufacture or statistical design. By understanding how to design processes and circuits to account for these variations, engineers can better manage performance and reliability in modern semiconductor manufacturing. This text is a specialized resource for those working within the Springer International Series in Engineering and Computer Science.

Key Features

Covers essential strategies for increasing yield in the IC industry to ensure product profitability.

Explains the two main paths to yield enhancement: manufacturing process control and statistical design.

Addresses the challenges of shrinking device sizes and the resulting fluctuations in IC fabrication.

Provides technical insights into design for manufacture techniques to minimize performance variations.

Part of the Springer International Series in Engineering and Computer Science, volume 86.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
21 September 2011
Listed Since
21 December 2012

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No barcode data available

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