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£136.54
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£137 today · previous high £137 · all-time low £134
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
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Price distribution over 71 days • 2 price levels
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Most common price: £137 (59 days, 83.1%)
Price range: £134 - £137
Price levels: 2 different prices over 71 days
Description
Key Features
This 2nd edition includes new chapters on Functional and Parametric Defect Models to improve testing accuracy.
Learn about Inductive Fault Analysis and Yield Engineering to establish a link between defect sources and yield.
The updated RAM testing chapter focuses on parametric and SRAM stability testing for modern circuits.
New material is incorporated into the digital fault modeling and analog testing chapters for updated technical knowledge.
This Springer publication provides industrial relevance for addressing failures in nano-metric technologies.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1441942858
- Domain
- Amazon UK
- Release Date
- 10 November 2010
- Listed Since
- 01 October 2010
Barcode
No barcode data available
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