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£136.54
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
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Description
Key Features
Updated content on Functional and Parametric Defect Models to improve testing accuracy.
New chapters on Inductive Fault Analysis and Yield Engineering to connect defects to yield.
Enhanced RAM testing sections with a specific focus on parametric and SRAM stability.
Expanded material covering digital fault modeling and analog testing methodologies.
Industry-focused approach designed for practical application in nano-metric CMOS VLSI circuits.
Part of the Frontiers in Electronic Testing series for specialized technical knowledge.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1441942858
- Domain
- Amazon UK
- Release Date
- 10 November 2010
- Listed Since
- 01 October 2010
Barcode
No barcode data available
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