Power-Aware Testing and Test Strategies for Low Power Devices - Image 1

£80.09

Springer Power-Aware Testing and Test Strategies for Low Power Devices

Name: Power-Aware Testing and Test Strategies for Low Power Devices
Brand: Springer
Price: 80.09 GBP
Availability: InStock

Computer Aided Design

This is the most expensive it has ever been. Walk away.

£80 today · previous high £80 · all-time low £77

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 635 days • 635 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 635 days • 4 price levels

Days at Price

Current Price

Price Analysis

Most common price: £80 (301 days, 47.4%)

Price range: £77 - £80

Price levels: 4 different prices over 635 days

Description

Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. From the Back Cover Power-Aware Testing and Test Strategies for Low-Power Devices Edited by: Patrick Girard, Research Director, CNRS / LIRMM, France Nicola Nicolici, Associate Professor, McMaster University, Canada Xiaoqing Wen, Professor, Kyushu Institute of Technology, Japan Managing the power consumption of circuits and systems is now considered as one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low-power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and Electronic Design Automation (EDA) solutions for testing low-power devices. The first comprehensive book on power-aware test for (low-power) circuits and systems Shows readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design-for-test and low-power design Covers in detail power-constrained test techniques, including power-aware automatic test pattern generation, design-for-test, built-in self-test and test compression Presents state-of-the-art industrial practices and EDA solutions

Product Specifications

Brand: Springer
Format: paperback
ASIN: 1489983139
Category: Books > Subjects > Computing & Internet > Software & Graphics > Graphics & Multimedia > Computer Aided Design
Domain: Amazon UK
Publication Date: 05 September 2014
Listed Since: 24 September 2014

Barcode

No barcode data available

Springer Power-Aware Testing and Test Strategies for Low Power Devices

This is the most expensive it has ever been. Walk away.

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Low-Power Electronics Design: 1 (Computer Engineering Series)

CMOS Test and Evaluation: A Physical Perspective

Principles of Testing Electronic Systems (Wiley-Interscience)

Power Management Techniques for Integrated Circuit Design (IEEE Press)

Electronics: Basic, Analog, and Digital with PSpice

Low-Power Design and Power-Aware Verification

Low-Power Design and Power-Aware Verification

ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis

Wiley-Blackwell Low-Voltage Mixed-Signal Circuits Book

Advanced Circuits for Emerging Technologies

Dynamic Power Management: Design Techniques and CAD Tools

Power Estimation and Optimization Methodologies for VLIW-based Embedded Systems

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Statistical Analysis and Optimization for VLSI: Timing and Power (Integrated Circuits and Systems)

Simulation and Optimization of Digital Circuits: Considering and Mitigating Destabilizing Factors

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Low Power Design Essentials (Integrated Circuits and Systems)

Emerging Devices for Low-Power and High-Performance Nanosystems: Physics, Novel Functions, and Data Processing (Jenny Stanford Series on Intelligent Nanosystems)

Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis: Proceedings of the 13th European ... (ESREF 2002) Rimini, Italy 7-11 October 2002

Wiley System Integration: Transistor Design to IC Circuits

Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology (Electronic Design Automation for Integrated Circuits Handbook)

Advances In 3D Integrated Circuits And Systems: 1 (Series on Emerging Technologies in Circuits and Systems)

CTL for Test Information of Digital ICs

Practical ESD Protection Design