On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11) - Image 1

£75.40

Springer On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)

Name: On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)
Brand: Springer
Price: 75.23 GBP
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Computer Aided Design

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Description

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Product Specifications

Brand: Springer
Format: Paperback
ASIN: 1441950338
Category: Books > Subjects > Computing & Internet > Software & Graphics > Graphics & Multimedia > Computer Aided Design
Domain: Amazon UK
Release Date: 06 December 2010
Listed Since: 01 October 2010

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Springer On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)

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