We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£75.36
Springer On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)
Price data last checked 42 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 3 months ago.
£75 today · all-time low £75 (Jun 2026) · usually the usual
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 49 days · 49 data points (no recent data)
Price Distribution
Price distribution over 49 days • 2 price levels
Price Analysis
Most common price: £75 (28 days, 57.1%)
Price range: £75 - £76
Price levels: 2 different prices over 49 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1441950338
- Domain
- Amazon UK
- Release Date
- 06 December 2010
- Listed Since
- 01 October 2010
Barcode
No barcode data available
Similar Products You Might Like
Testing of Interposer-Based 2.5D Integrated Circuits
Springer
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
Springer
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
Springer
Integrated Circuit Test Engineering: Modern Techniques
Springer
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)
Morgan Kaufmann
Testing Chips with Mesh-Based Network-on-Chip
LAP Lambert Academic Publishing
Digital VLSI Design with Verilog: A Textbook from Silicon Valley Polytechnic Institute
Springer
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer
Boundary-Scan Interconnect Diagnosis: 18 (Frontiers in Electronic Testing, 18)
Springer
Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing, 29)
Springer
A Designer’s Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19)
Springer
Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Information Science Reference
Springer Sequential Logic Testing and Verification - Book 163
Springer
High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)
Artech House
Testing Active and Passive Electronic Components: 38 (Electrical and Computer Engineering)
Routledge
Glsvlsi '19: Proceedings of the 2019 Great Lakes Symposium on VLSI
MCA
CTL for Test Information of Digital ICs
Springer
Springer Introduction to Advanced SoC Test Design and Optimization
Springer
VLSI Design and Test for Systems Dependability
Springer
IDDQ Testing of VLSI Circuits
Springer
VLSI Design and Test for Systems Dependability
Springer