Springer Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing, 29)

CTL for Test Information of Digital ICs

Springer

Principles of Testing Electronic Systems (Wiley-Interscience)

Wiley

Integrated Circuit Test Engineering: Modern Techniques

Springer

Essential Issues in SOC Design: Designing Complex Systems-on-Chip

Springer

A Practical Approach to VLSI System on Chip (SoC) Design: A Comprehensive Guide

Springer

The Simple Art of SoC Design: Closing the Gap between RTL and ESL

Springer

Soft Errors in Modern Electronic Systems: 41 (Frontiers in Electronic Testing, 41)

Springer

System-level Test and Validation of Hardware/Software Systems: 17 (Springer Series in Advanced Microelectronics, 17)

Springer

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

Reliability, Availability and Serviceability of Networks-on-Chip

Springer

System-on-Chip Security: Validation and Verification

Springer

High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)

Artech House

System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)

Morgan Kaufmann

Fundamentals of IP and SoC Security: Design, Verification, and Debug

Springer

Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow

CRC Press

Fundamentals of IP and SoC Security: Design, Verification, and Debug

Springer

SystemVerilog for Verification: A Guide to Learning the Testbench Language Features

Springer

IEEE International Test Conference 2001

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

CRC Press

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits: 19 (Devices, Circuits, and Systems)

CRC Press

Architecture Design for Soft Errors

Morgan Kaufmann

SystemVerilog for Verification: A Guide to Learning the Testbench Language Features

Springer