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Springer Design for AT-Speed Test, Diagnosis and Measurement - Book

Amazon

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Description

Design for AT-Speed Test, Diagnosis and Measurement is the first comprehensive book offering practical and proven design-for-testability (DFT) solutions for chip and system design engineers, test engineers and product managers. This essential resource covers silicon-level implementation through board and systems-level applications, demonstrating how embedded test enables simplification of silicon debug and system bring-up. Test engineers will discover how embedded test provides superior at-speed test, diagnosis and measurement capabilities without exceeding equipment limitations. Product managers gain strategic insights into cost-effective testing approaches. Published by Springer as part of the Frontiers in Electronic Testing series (volume 15), this book bridges the gap between theoretical DFT principles and real-world implementation, making it invaluable for anyone involved in modern chip design, validation and production testing.

Key Features

Design for AT-Speed Test, Diagnosis and Measurement covers practical DFT solutions applicable to silicon, board and systems-level design environments.

The book demonstrates how embedded test implementation simplifies silicon debug processes and accelerates system bring-up cycles.

Springer's volume 15 in the Frontiers in Electronic Testing series provides test engineers with methods to achieve superior at-speed testing without exceeding equipment capabilities.

Product managers will learn strategic approaches to testing that balance cost, time and technical requirements in manufacturing and validation.

This resource addresses the complete design-for-testability lifecycle from initial chip design through production measurement and diagnosis.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
26 April 2013
Listed Since
22 September 2013

Barcode

No barcode data available

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