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£107.98
Springer Design for AT-Speed Test, Diagnosis and Measurement
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Description
Key Features
Provides proven design-for-testability (DFT) solutions for chip and system design engineers.
Explains how embedded test implementation simplifies silicon debug and system bring-up.
Offers methods for superior at-speed test, diagnosis, and measurement.
Helps test engineers maximize the capabilities of their existing equipment.
Applicable to professionals working at the silicon, board, and system levels.
Part of the Frontiers in Electronic Testing series by Springer.
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 1475782918
- Domain
- Amazon UK
- Publication Date
- 26 April 2013
- Listed Since
- 22 September 2013
Barcode
No barcode data available
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