£54.99

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Morgan Kaufmann VLSI Test Principles and Architectures: Design for Testability

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£54.99 £52.24 £53.34 £54.44 £55.54 £56.64 £57.74 25 July 2026 08 August 2026 22 August 2026 05 September 2026 19 September 2026
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Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
06 December 2014
Listed Since
02 October 2014

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No barcode data available

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