£54.99

Morgan Kaufmann VLSI Test Principles and Architectures: Design for Testability

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Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Product Specifications
Brand
Morgan Kaufmann
Format
paperback
ASIN
1493300865
Category
Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
Domain
Amazon UK
Release Date
06 December 2014
Listed Since
02 October 2014

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No barcode data available

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