Morgan Kaufmann VLSI Test Principles and Architectures: Design for Testability

High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)

Artech House

VLSI Circuit Design Methodology Demystified: A Conceptual Taxonomy

Wiley-IEEE Press

System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)

Morgan Kaufmann

Efficient Test Data Compression and Fault Analysis in VLSI Circuits: Test Data Compression and Decompression Using Efficient Bitmask and Dictionary Selection Method

Scholars' Press

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

VLSI Design Handbook: Volume II: 2

Clanrye International

Modern VLSI Design: Systems on Silicon

Prentice Hall

Learning from VLSI Design Experience

Springer

Recent Advances in VLSI Design

Clanrye International

Digital Design from the VLSI Perspective: Concepts for VLSI Beginners

Springer

Principles of VLSI RTL Design: A Practical Guide

Springer

ISTFA 2019: Proceedings from the 45th International Symposium for Testing and Failure Analysis

Digital VLSI Design and Simulation with Verilog

Wiley

A Practical Approach to VLSI System on Chip (SoC) Design: A Comprehensive Guide

Springer