£77.50

International Conference on Microelectronic Test Structures 1993

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Price range: £78 - £78

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Description

This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
30 April 1994
Listed Since
19 October 2006

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