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International Conference on Microelectronic Test Structures 1993

Amazon

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£77.50 £73.63 £75.18 £76.73 £78.28 £79.83 £81.38 26 October 2024 23 April 2025 20 October 2025 17 April 2026 14 October 2026
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Description

This international conference covers advances in recent developments and future directions on all microelectronic test structures and their applications for characterisation of device matching, critical dimension, parameter extraction, yield reliability, and interconnection.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
01 January 1993
Listed Since
19 October 2006

Barcode

No barcode data available

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