We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
Out of stock
This item is currently unavailable
IEEE International Test Conference 2001
Price data last checked 35 day(s) ago - refreshing...
One email. No newsletter. No nudges.
Gone for 179 days. Could come back at any time — we're watching for you.
Out of stock 179 days · last price £226 · longest previous gap was 1 days
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 696 days · 696 data points (no recent data)
Price Distribution
Price distribution over 696 days • 1 price levels
Price Analysis
Most common price: £226 (696 days, 100.0%)
Price range: £226 - £226
Price levels: 1 different prices over 696 days
Description
Product Specifications
- Format
- hardcover
- ASIN
- 0780371690
- Domain
- Amazon UK
- Release Date
- 01 December 2001
- Listed Since
- 01 March 2010
Barcode
No barcode data available
Similar Products You Might Like
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
International Conference on Microelectronic Test Structures 1993
Price unavailable
Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
Springer
Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Information Science Reference
Springer Design for AT-Speed Test, Diagnosis and Measurement
Springer
High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)
Artech House
Testing of Interposer-Based 2.5D Integrated Circuits
Springer
VLSI Test Principles and Architectures: Design for Testability
Morgan Kaufmann
Multi-run Memory Tests for Pattern Sensitive Faults
Springer
Springer Introduction to Advanced SoC Test Design and Optimization
Springer
The 2016-2021 Outlook for Semiconductor Testing Equipment in the United States
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
Springer
Efficient Test Data Compression and Fault Analysis in VLSI Circuits: Test Data Compression and Decompression Using Efficient Bitmask and Dictionary Selection Method
Scholars' Press
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
Microelectronics, Electromagnetics and Telecommunications: Proceedings of the Fourth ICMEET 2018: 521 (Lecture Notes in Electrical Engineering, 521)
Springer
SystemVerilog for Verification: A Guide to Learning the Testbench Language Features
Springer
Testing Active and Passive Electronic Components: 38 (Electrical and Computer Engineering)
CRC Press
Integrated Circuit Test Engineering: Modern Techniques
Springer
Testing Chips with Mesh-Based Network-on-Chip
LAP Lambert Academic Publishing
Semiconductor Memories: Technology, Testing, and Reliability
Wiley
ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
Brand: ASM International
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
Morgan Kaufmann
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
Springer
SystemVerilog for Verification: A Guide to Learning the Testbench Language Features
Springer