IEEE International Test Conference 2001

Wiley-IEEE Press Digital Systems Testing and Testable Design

Wiley-IEEE Press

ASM International ISTFA 2021 - Conference Proceedings

Brand: ASM International

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

ISTFA 2011: Proceedings from the 37th International Symposium for Testing and Failure Analysis

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits: 19 (Devices, Circuits, and Systems)

CRC Press

Microelectronics Failure Analysis Desk Reference

Micro-electro-mechanical systems (MEMS)--2001: Presented at the 2001 ASME International Mechanical Engineering Congress and Exposition : November 11-16, 2001, New York, New York (MEMS)

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

15th Reliability, Stress Analysis, and Failure Prevention Conference and International Issues in Engineering Design

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Springer

Springer Design for AT-Speed Test, Diagnosis and Measurement

Springer

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)

Springer

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)

Springer

Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)

Springer

Semiconductor Memories: Technology, Testing, and Reliability

Wiley

Reliability, Availability and Serviceability of Networks-on-Chip

Springer

CTL for Test Information of Digital ICs

Springer

Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)

Information Science Reference

Wiley Digital Logic Testing and Simulation - Engineering Book

Wiley

A Designer’s Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19)

Springer

Efficient Test Methodologies for High-Speed Serial Links: 51 (Lecture Notes in Electrical Engineering, 51)

Springer

International Conference on Microelectronic Test Structures 1993

Durability Analysis of Composite Systems 2001: Proceedings of the 5th International Conference , DURACOSYS 2001, tokyo, 6-9 November 2001

CRC Press

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

CRC Press