Semiconductor Memories: Technology, Testing, and Reliability - Image 1

£154.26

Wiley Semiconductor Memories: Technology, Testing, and Reliability

Name: Semiconductor Memories: Technology, Testing, and Reliability
Brand: Wiley
Price: 108.45 GBP
Availability: InStock

Architecture & Microprocessors

Price History & Forecast

Last 7 days • 7 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 7 days • 3 price levels

Days at Price

Current Price

Price Analysis

Most common price: £158 (4 days, 57.1%)

Price range: £108 - £158

Price levels: 3 different prices over 7 days

Description

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.

Product Specifications

Brand: Wiley
Format: hardcover
ASIN: 0780310004
Category: Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
Domain: Amazon UK
Release Date: 24 September 2002
Listed Since: 15 February 2007

Barcode

No barcode data available

Wiley Semiconductor Memories: Technology, Testing, and Reliability

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Wiley-Blackwell Semiconductor Memories Handbook - Design and Tech

Semiconductor Memories: A Handbook of Design, Manufacture and Application

Advanced Semiconductor Memories: Architectures, Designs, and Applications

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Wiley-IEEE Press Digital Systems Testing and Testable Design

Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy (Quality and Reliability Engineering)

Principles of Testing Electronic Systems (Wiley-Interscience)

Integrated Circuit Failure Analysis: A Guide to Preparation Techniques (Quality and Reliability Engineering Series)

Silicon Based Unified Memory Devices and Technology

Vertical 3D Memory Technologies

Failure Mechanisms in Semiconductor Devices

Semiconductor Memory Devices and Circuits

Nonvolatile Memory Technologies with Emphasis on Flash: A Comprehensive Guide to Understanding and Using Flash Memory Devices: 8 (IEEE Press Series on Microelectronic Systems)

MEMS Reliability (MEMS Reference Shelf)

Semiconductor Memory Devices and Circuits

Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Wiley Nonvolatile Semiconductor Memory Technology Guide

Digital Design and Fabrication (Computer Engineering Series)

Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)

System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)

Fundamentals of Semiconductor Manufacturing and Process Control (IEEE Press)

Reliability and Failure of Electronic Materials and Devices

Integrated Circuit Manufacturability: The Art of Process and Design Integration