Springer Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing, 40)

Springer

Robust SRAM Designs and Analysis

Springer

Advanced Semiconductor Memories: Architectures, Designs, and Applications

Wiley-IEEE Press

Ultra-Low Voltage Nano-Scale Memories (Integrated Circuits and Systems)

Springer

Dynamic RAM: Technology Advancements

CRC Press

In Search of the Next Memory: Inside the Circuitry from the Oldest to the Emerging Non-Volatile Memories

Springer

Current Sense Amplifiers for Embedded SRAM in High-Performance System-on-a-Chip Designs: 12 (Springer Series in Advanced Microelectronics, 12)

Springer

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits: 19 (Devices, Circuits, and Systems)

CRC Press

Semiconductor Memory Devices and Circuits

CRC Press

Semiconductor Memory Devices and Circuits

CRC Press

System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)

Morgan Kaufmann

Springer - Microscale Diagnostic Techniques Book

Springer

Semiconductor Memories: Technology, Testing, and Reliability

Wiley

CMOS Processors and Memories (Analog Circuits and Signal Processing)

Springer

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

Woodhead Publishing Semiconductor Memories and Systems Book

Woodhead Publishing

Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip

Springer

Microelectronics Failure Analysis Desk Reference

3D Flash Memories

Springer

3D Flash Memories

Springer

Springer - Static Timing Analysis for Nanometer Designs

Springer

Static Timing Analysis for Nanometer Designs: A Practical Approach

Springer

Electrical Atomic Force Microscopy for Nanoelectronics (NanoScience and Technology)

Springer

Metrology and Diagnostic Techniques for Nanoelectronics

Taylor & Francis