We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£59.04
Wiley-IEEE Press Digital Systems Testing and Testable Design
Price data last checked 51 day(s) ago - refreshing...
Price History & Forecast
Last 40 days • 40 data points (No recent data available)
Price Distribution
Price distribution over 40 days • 3 price levels
Price Analysis
Most common price: £59 (15 days, 37.5%)
Price range: £58 - £59
Price levels: 3 different prices over 40 days
Description
Key Features
Comprehensive coverage of test generation and fault modeling for both classic and new technologies.
In-depth technical discussions on simulation, fault simulation, and diagnosis methods.
Detailed guidance on design for testability and built-in self-test techniques.
Includes numerous problems to help engineers and students practice and master concepts.
An essential reference for ASIC and system designers and CAD developers.
Updated content to help advanced engineering students stay current with industry changes.
Product Specifications
- Brand
- Wiley-IEEE Press
- Format
- Hardcover
- ASIN
- 0780310624
- Domain
- Amazon UK
- Release Date
- 13 September 1994
- Listed Since
- 15 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Wiley Digital Logic Testing and Simulation - Engineering Book
Wiley
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Information Science Reference
Advanced Signal Integrity for High-Speed Digital Designs (IEEE Press)
Wiley-IEEE Press
Digital System Test and Testable Design: Using HDL Models and Architectures
Springer
Simulation Digital Electronic Sys (Electronics Texts for Engineers and Scientists)
Cambridge University Press
Introduction to Digital Systems: Modeling, Synthesis, and Simulation Using VHDL
Wiley
Wiley-IEEE Press Digital System Clocking - Advanced Design Book
Wiley-IEEE Press
Advanced FPGA Design: Architecture, Implementation, and Optimization (IEEE Press)
Wiley
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
CRC Press
Semiconductor Memories: Technology, Testing, and Reliability
Wiley
Digital Systems Engineering
Cambridge University Press
Digital VLSI Design and Simulation with Verilog
Wiley
Test Engineering: A Concise Guide to Cost-effective Design, Development and Manufacture (Quality and Reliability Engineering Series)
Wiley
Digital Television: Technology and Standards
Wiley
The Engineering Design of Systems: Models and Methods
Wiley
Digital VLSI Systems Design: A Design Manual for Implementation of Projects on FPGAs and ASICs Using Verilog
Springer
Digital Transmission Systems
Springer
VLSI Design and Test for Systems Dependability
Springer
VLSI Design and Test for Systems Dependability
Springer
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)
Morgan Kaufmann
Signal Integrity and Radiated Emission of High-Speed Digital Systems
Wiley
Built In Test for VLSI: Pseudorandom Techniques
Wiley
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer