Built In Test for VLSI: Pseudorandom Techniques - Image 1

Price loading...

Wiley Built In Test for VLSI: Pseudorandom Techniques

Name: Built In Test for VLSI: Pseudorandom Techniques
Brand: Wiley

Circuits

Price History & Forecast

No Price Data Available

Price history will appear here once data is collected from Amazon.

Price Distribution

No price data available for histogram

Description

This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.

Product Specifications

Brand: Wiley
Format: Hardcover
ASIN: 0471624632
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Circuits
Domain: Amazon UK
Release Date: 02 December 1987
Listed Since: 09 February 2007

Barcode

No barcode data available

Wiley Built In Test for VLSI: Pseudorandom Techniques

Price History & Forecast

No Price Data Available

Price Distribution

Description

Product Specifications

Barcode

Similar Products You Might Like

Principles of Testing Electronic Systems (Wiley-Interscience)

Random Testing of Digital Circuits: Theory and Applications

Wiley-IEEE Press Digital Systems Testing and Testable Design

Wiley Digital Logic Testing and Simulation - Engineering Book

Stochastic Simulation (Wiley Series in Probability and Statistics)

Digital System Test and Testable Design: Using HDL Models and Architectures

Test Generation of Crosstalk Delay Faults in VLSI Circuits

Digital VLSI Design with Verilog: A Textbook from Silicon Valley Polytechnic Institute

A Designer’s Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19)

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)

Low-Power CMOS VLSI Circuit Design

Design Through Verilog HDL

Digital VLSI Design and Simulation with Verilog

Introduction to Digital Systems: Modeling, Synthesis, and Simulation Using VHDL

Introduction to VLSI Systems: A Logic, Circuit, and System Perspective

VLSI-Design of Non-Volatile Memories

Integrated Circuit Test Engineering: Modern Techniques

Springer Statistical Analysis and Optimization for VLSI Book

Intellectual Property Protection in VLSI Designs: Theory and Practice

Testing of Interposer-Based 2.5D Integrated Circuits

RTL Hardware Design Using VHDL: Coding for Efficiency, Portability, and Scalability (IEEE Press)

VLSI Design and Test for Systems Dependability

VLSI Design and Test for Systems Dependability