We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£182.00
Wiley Built In Test for VLSI: Pseudorandom Techniques
Price data last checked 45 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£182 today · previous high £182 · all-time low £180
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 46 days · 46 data points (no recent data)
Price Distribution
Price distribution over 46 days • 2 price levels
Price Analysis
Most common price: £182 (43 days, 93.5%)
Price range: £180 - £182
Price levels: 2 different prices over 46 days
Description
Product Specifications
- Brand
- Wiley
- Format
- hardcover
- ASIN
- 0471624632
- Domain
- Amazon UK
- Release Date
- 02 December 1987
- Listed Since
- 09 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Probabilistische Verfahren für den Test hochintegrierter Schaltungen: 140 (Informatik-Fachberichte, 140)
Springer
Random Testing of Digital Circuits: Theory and Applications
CRC Press
A Designer’s Guide to Built-In Self-Test: 19 (Frontiers in Electronic Testing, 19)
Springer
High-Level Test Synthesis of Digital VLSI Circuits (Artech House Solid-State Technology Library)
Artech House
Principles of Testing Electronic Systems (Wiley-Interscience)
Wiley
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
Fehlerdiagnose für Schaltnetze aus Modulen mit partiell injektiven Pfadfunktionen: 139 (Informatik-Fachberichte, 139)
Springer
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
CRC Press
Boolean Circuit Rewiring: Bridging Logical and Physical Designs
Wiley
Wiley Digital Logic Testing and Simulation - Engineering Book
Wiley
Integrated Circuit Test Engineering: Modern Techniques
Springer
Digital VLSI Design and Simulation with Verilog
Wiley
Design of Digital Systems and Devices: 79 (Lecture Notes in Electrical Engineering, 79)
Springer
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
Springer
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
Springer
SystemVerilog for Verification: A Guide to Learning the Testbench Language Features
Springer
Introduction to Digital Systems: Modeling, Synthesis, and Simulation Using VHDL
Wiley
Intellectual Property Protection in VLSI Designs: Theory and Practice
Springer
Switch-Level Timing Simulation of MOS VLSI Circuits: 66 (The Springer International Series in Engineering and Computer Science, 66)
Springer
Digital Logic Design Using Verilog: Coding and RTL Synthesis
Springer
SystemVerilog for Verification: A Guide to Learning the Testbench Language Features
Springer
On-Line Testing for VLSI: 11 (Frontiers in Electronic Testing, 11)
Springer
Reconfigurable System Design and Verification
CRC Press