We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£76.00
LAP Lambert Academic Publishing Practical Fault Finding in Electronic Devices
Price data last checked 30 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£76 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 61 days • 61 data points (No recent data available)
Price Distribution
Price distribution over 61 days • 1 price levels
Price Analysis
Most common price: £76 (61 days, 100.0%)
Price range: £76 - £76
Price levels: 1 different prices over 61 days
Description
Product Specifications
- Format
- paperback
- ASIN
- 6202796308
- Domain
- Amazon UK
- Release Date
- 19 August 2020
- Listed Since
- 13 September 2020
Barcode
No barcode data available
Similar Products You Might Like
Microelectronics Manufacturing Diagnostics Handbook
Springer
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
Springer
Electronic Failure Analysis Handbook
McGraw-Hill Education
Microelectronics Failure Analysis Desk Reference
Design and Test Technology for Dependable Systems-on-Chip (Advances in Computer and Electrical Engineering)
Information Science Reference
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley
Soft Errors in Modern Electronic Systems: 41 (Frontiers in Electronic Testing, 41)
Springer
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems: 4 (Quality and Reliability Engineering Series)
Wiley
Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Springer
Integrated Circuit Failure Analysis: A Guide to Preparation Techniques (Quality and Reliability Engineering Series)
Wiley
Electronics for Computer Technology
Testing Active and Passive Electronic Components: 38 (Electrical and Computer Engineering)
CRC Press
Boundary-Scan Interconnect Diagnosis: 18 (Frontiers in Electronic Testing, 18)
Springer
Data Mining and Diagnosing IC Fails: 31 (Frontiers in Electronic Testing, 31)
Springer
Springer Design for AT-Speed Test, Diagnosis and Measurement
Springer
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications: 5 (Frontiers in Electronic Testing, 5)
Springer
Reliability and Failure of Electronic Materials and Devices
Academic Press
Springer Advanced Solutions in Diagnostics and Fault Tolerant Control
Springer
Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
Springer
Fast Circuit Boards: Energy Management
Wiley
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32)
Springer
Design for Excellence in Electronics Manufacturing (Quality and Reliability Engineering Series)
Wiley
Springer - Microelectronic Test Structures for CMOS Technology
Springer
Integrated Circuit Test Engineering: Modern Techniques
Springer