We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£225.00
It has never been this cheap. We have no record of a lower price.
£225 today · cheaper than every other day in the last 3 months
Microelectronics Failure Analysis Desk Reference
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 25 days · 25 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 25 days • 1 price levels
Price Analysis
Most common price: £225 (25 days, 100.0%)
Price range: £225 - £225
Price levels: 1 different prices over 25 days
Description
Product Specifications
- Format
- hardcover
- ASIN
- 161503725X
- Domain
- Amazon UK
- Release Date
- 15 July 2011
- Listed Since
- 16 March 2011
Barcode
No barcode data available
Similar Products You Might Like
ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley
Integrated Circuit Failure Analysis: A Guide to Preparation Techniques (Quality and Reliability Engineering Series)
Wiley
Reliability and Failure of Electronic Materials and Devices
Academic Press
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems: 4 (Quality and Reliability Engineering Series)
Wiley
Microelectronics Manufacturing Diagnostics Handbook
Springer
Guidebook for Managing Silicon Chip Reliability: 5 (Electronic Packaging)
CRC Press
Semiconductor Process Reliability in Practice (ELECTRONICS)
McGraw-Hill Education
Failure Mechanisms in Semiconductor Devices
Wiley
Mechanics of Microelectronics: 141 (Solid Mechanics and Its Applications, 141)
Springer
Electronic Failure Analysis Handbook
McGraw-Hill Education
Bias Temperature Instability for Devices and Circuits - Springer
Springer
Practical Fault Finding in Electronic Devices
LAP Lambert Academic Publishing
Reliability and Failure of Electronic Materials and Devices
Elsevier
Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis: Proceedings of the 13th European ... (ESREF 2002) Rimini, Italy 7-11 October 2002
Elsevier
Springer Defect-Oriented Testing for Nano-Metric CMOS VLSI
Springer
Reliability and Failure of Electronic Materials and Devices
Academic Press
Wiley Design for Excellence in Electronics Manufacturing Book
Wiley
Digital Design and Fabrication (Computer Engineering Series)
CRC Press
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Wiley
Microelectronics, Second Edition - CRC Press Electronics Handbook
CRC Press
Essentials of Electronic Packaging: a Multidisciplinary Approach (Electronic Packaging Book Series) (Asme Press Book Series on Electronic Packaging)
ASME Press
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits: 19 (Devices, Circuits, and Systems)
CRC Press
Handbook of Semiconductor Manufacturing Technology
CRC Press