We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£95.49
Academic Press Reliability and Failure of Electronic Materials and Devices
Price data last checked 102 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£95 today · cheaper than every other day in the last 24 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 629 days • 629 data points (No recent data available)
Price Distribution
Price distribution over 629 days • 5 price levels
Price Analysis
Most common price: £96 (267 days, 42.4%)
Price range: £96 - £102
Price levels: 5 different prices over 629 days
Description
Product Specifications
- Brand
- Academic Press
- Format
- hardcover
- ASIN
- 0120885743
- Domain
- Amazon UK
- Release Date
- 21 October 2014
- Listed Since
- 04 December 2006
Barcode
No barcode data available
Similar Products You Might Like
Reliability and Failure of Electronic Materials and Devices
Academic Press
Reliability and Failure of Electronic Materials and Devices
Academic Press
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems: 4 (Quality and Reliability Engineering Series)
Wiley
Guidebook for Managing Silicon Chip Reliability: 5 (Electronic Packaging)
CRC Press
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging: Volume I Materials Physics - Materials ... Physical Design - Reliability and Packaging
Springer
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley
Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis: Proceedings of the 13th European ... (ESREF 2002) Rimini, Italy 7-11 October 2002
Pergamon
Semiconductor Process Reliability in Practice (ELECTRONICS)
McGraw-Hill Education
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Springer
Failure Mechanisms in Semiconductor Devices
Wiley
Electronic Thin-Film Reliability
Cambridge University Press
Microelectronics Failure Analysis Desk Reference
Advanced Materials for Interconnections (Volume 66) (European Materials Research Society Symposia Proceedings, Volume 66)
Elsevier
Microelectronics Manufacturing Diagnostics Handbook
Springer
Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)
Springer
Electromigration in Metals: Fundamentals to Nano-Interconnects
Reliability of Electronic Components: A Practical Guide to Electronic Systems Manufacturing
Springer
Springer - Materials and Reliability Handbook for Semiconductors
Springer
ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis
New Developments in Semiconductor Research
Brand: Nova Science Pub Inc
Trends in Semiconductor Research
Wiley Thermal Management Materials for Electronic Packaging
Wiley
Frontal Semiconductor Research