£58.39

Cambridge University Press Electronic Thin-Film Reliability

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£58 today · usual range £52–£60 · best ever £52

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£60.00 £50.83 £52.83 £54.83 £56.83 £58.83 £60.83 26 April 2026 14 May 2026 01 June 2026 19 June 2026 08 July 2026

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19 days 15 days 2 days · current 38 days 0 10 19 29 38 £52 £57 £58 £60 Days at Price

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Most common price: £60 (38 days, 51.4%)

Price range: £52 - £60

Price levels: 4 different prices over 74 days

Description

Thin films are widely used in the electronic device industry. As the trend for miniaturization of electronic devices moves into the nanoscale domain, the reliability of thin films becomes an increasing concern. Building on the author's previous book, Electronic Thin Film Science by Tu, Mayer and Feldman, and based on a graduate course at UCLA given by the author, this new book focuses on reliability science and the processing of thin films. Early chapters address fundamental topics in thin film processes and reliability, including deposition, surface energy and atomic diffusion, before moving onto systematically explain irreversible processes in interconnect and packaging technologies. Describing electromigration, thermomigration and stress migration, with a closing chapter dedicated to failure analysis, the reader will come away with a complete theoretical and practical understanding of electronic thin film reliability. Kept mathematically simple, with real-world examples, this book is ideal for graduate students, researchers and practitioners.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
25 November 2010
Listed Since
15 February 2010

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