Reliability and Failure of Electronic Materials and Devices - Image 1

£103.69

Academic Press Reliability and Failure of Electronic Materials and Devices

Name: Reliability and Failure of Electronic Materials and Devices
Brand: Academic Press
Price: 103.69 GBP
Availability: InStock

Illustrated

Chemistry

Price History & Forecast

Last 41 days • 41 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 41 days • 1 price levels

Days at Price

Price Analysis

Most common price: £104 (41 days, 100.0%)

Price range: £104 - £104

Price levels: 1 different prices over 41 days

Description

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed. The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise. Discusses reliability and failure on both the chip and packaging levels Handles the role of defects in yield and reliability Includes a tutorial chapter on the mathematics of reliability Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints Considers defect detection methods and failure analysis techniques

Product Specifications

Brand: Academic Press
Model: Illustrated
Format: hardcover
ASIN: 0125249853
Category: Books > Subjects > Science, Nature & Maths > Chemistry
Domain: Amazon UK
Release Date: 16 June 1998
Listed Since: 06 February 2007

Barcode

No barcode data available

Academic Press Reliability and Failure of Electronic Materials and Devices

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices

Guidebook for Managing Silicon Chip Reliability: 5 (Electronic Packaging)

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems: 4 (Quality and Reliability Engineering Series)

Wiley Quality Conformance of Microelectronic Packages Book

Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging: Volume I Materials Physics - Materials ... Physical Design - Reliability and Packaging

Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Springer - Materials and Reliability Handbook for Semiconductors

Electronic Thin-Film Reliability

Integrated Circuit, Hybrid, and Multichip Module Package Design Guidelines: A Focus on Reliability

Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)

Defects in Microelectronic Materials and Devices

Reliability and Failure Analysis of High-Power LED Packaging (Woodhead Publishing Series in Electronic and Optical Materials)

Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging: Volume I Materials Physics - Materials ... ... Physical Design - Reliability and Packaging

Electromigration in Metals: Fundamentals to Nano-Interconnects

Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

New Developments in Semiconductor Research

Component Reliability for Electronic Systems (Artech House Remote Sensing Library)

New Research on Semiconductors - Nova Science Publishers Inc

ESD: Failure Mechanisms and Models

Thermal Stress and Strain in Microelectronics Packaging

Improving Reliability and Quality for Product Success

Frontal Semiconductor Research