We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£229.09
It has never been this cheap. We have no record of a lower price.
£229 today · cheaper than every other day in the last 3 months
Springer Semiconductor Device Reliability: 175 (NATO Science Series E:, 175)
Price data last checked 57 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 34 days · 34 data points (no recent data)
Price data last checked 57 day(s) ago - refreshing...
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 34 days • 1 price levels
Price Analysis
Most common price: £229 (34 days, 100.0%)
Price range: £229 - £229
Price levels: 1 different prices over 34 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 9401076200
- Domain
- Amazon UK
- Release Date
- 05 October 2011
- Listed Since
- 21 December 2012
Barcode
No barcode data available
Similar Products You Might Like
Reliability and Failure of Electronic Materials and Devices
Academic Press
Failure Mechanisms in Semiconductor Devices
Wiley
Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Springer
Guidebook for Managing Silicon Chip Reliability: 5 (Electronic Packaging)
CRC Press
Reliability and Failure of Electronic Materials and Devices
Elsevier
Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis: Proceedings of the 13th European ... (ESREF 2002) Rimini, Italy 7-11 October 2002
Elsevier
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley
Semiconductor Process Reliability in Practice (ELECTRONICS)
McGraw-Hill Education
Materials and Reliability Handbook - Semiconductor Optical Devices
Springer
Reliability of Electronic Components: A Practical Guide to Electronic Systems Manufacturing
Springer
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems: 4 (Quality and Reliability Engineering Series)
Wiley
VLSI Design and Test for Systems Dependability
Springer
VLSI Design and Test for Systems Dependability
Springer
AI Techniques for Reliability Prediction for Electronic Components
Engineering Science Reference
AI Techniques for Reliability Prediction for Electronic Components
IGI Global
Reliability and Failure Analysis of High-Power LED Packaging (Woodhead Publishing Series in Electronic and Optical Materials)
Elsevier
Nanoscale Memory Repair (Integrated Circuits and Systems)
Springer
Wiley Microelectronic Package Quality and Qualification Book
Wiley
Crucial Issues in Semiconductor Materials and Processing Technologies: (Closed)): 222 (NATO Science Series E:)
Springer
Semiconductor Packaging: Materials Interaction and Reliability
CRC Press
Semiconductor Packaging: Materials Interaction and Reliability
CRC Press
New Developments in Semiconductor Research
Brand: Nova Science Pub Inc
Hot-Carrier Reliability of MOS VLSI Circuits: 227 (The Springer International Series in Engineering and Computer Science, 227)
Springer