Failure Mechanisms in Semiconductor Devices - Image 1

£166.59

Wiley Failure Mechanisms in Semiconductor Devices

Name: Failure Mechanisms in Semiconductor Devices
Brand: Wiley
Price: 168.69 GBP
Availability: InStock

Electrical

Price History & Forecast

Last 43 days • 43 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 43 days • 2 price levels

Days at Price

Current Price

Price Analysis

Most common price: £168 (23 days, 53.5%)

Price range: £167 - £168

Price levels: 2 different prices over 43 days

Description

Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book analyses the main failure mechanisms in terms of cause, effects and prevention and explains the mathematics behind reliability analysis. The authors detail methodologies for the identification of failures and describe the approaches for building reliability into semiconductor devices. Their thorough yet accessible text covers the physics of failure mechanisms from the semiconductor die itself to the packaging and interconnections. Incorporating recent advances, this comprehensive survey of semiconductor reliability will be an asset to both engineers and graduate students in the field.

Product Specifications

Brand: Wiley
Format: Hardcover
ASIN: 0471954829
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical
Domain: Amazon UK
Release Date: 20 June 1997
Listed Since: 09 February 2007

Barcode

No barcode data available

Wiley Failure Mechanisms in Semiconductor Devices

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Reliability and Failure of Electronic Materials and Devices

Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)

Reliability and Failure of Electronic Materials and Devices

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Integrated Circuit Failure Analysis: A Guide to Preparation Techniques (Quality and Reliability Engineering Series)

Reliability and Failure of Electronic Materials and Devices

ESD: Failure Mechanisms and Models

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems: 4 (Quality and Reliability Engineering Series)

Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy (Quality and Reliability Engineering)

Semiconductor Memories: Technology, Testing, and Reliability

Guidebook for Managing Silicon Chip Reliability: 5 (Electronic Packaging)

Integrated Circuit Quality and Reliability (Electrical and Computer Engineering)

Fundamentals of Semiconductor Manufacturing and Process Control (IEEE Press)

Semiconductor Power Devices: Physics, Characteristics, Reliability

Semiconductor Power Devices: Physics, Characteristics, Reliability

Microelectronics Failure Analysis Desk Reference

Semiconductor Devices: Physics and Technology

Wiley Quality Conformance of Microelectronic Packages Book

Semiconductor Power Devices: Physics, Characteristics, Reliability

Power Microelectronics: Device and Process Technologies (Second Edition)

Advanced Theory of Semiconductor Devices

Advanced Ultra Low-Power Semiconductor Devices: Design and Applications

Semiconductor Physical Electronics

Product Reliability, Maintainability, and Supportability Handbook