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Springer Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

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£124.50 £121.19 £121.91 £122.63 £123.36 £124.08 £124.80 25 July 2026 11 August 2026 28 August 2026 14 September 2026 01 October 2026
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48 days 21 days · current 0 12 24 36 48 £122 £125 Days at Price

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Most common price: £122 (48 days, 69.6%)

Price range: £122 - £125

Price levels: 2 different prices over 69 days

Description

The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.

Product Specifications

Format
paperback
Domain
Amazon UK
Publication Date
14 March 2014
Listed Since
06 August 2014

Barcode

No barcode data available

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