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Wiley-IEEE Press Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Name: Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Brand: Wiley-IEEE Press

Computer Science

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Description

This invaluable resource tells the complete story of failure mechanisms―from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.

Product Specifications

Brand: Wiley-IEEE Press
Format: hardcover
ASIN: 0471731722
Category: Books > Subjects > Computing & Internet > Computer Science
Domain: Amazon UK
Release Date: 04 September 2009
Listed Since: 08 December 2006

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Wiley-IEEE Press Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

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