We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£185.00
ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis
Price data last checked 44 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£185 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 47 days · 47 data points (no recent data)
Price Distribution
Price distribution over 47 days • 1 price levels
Price Analysis
Most common price: £185 (47 days, 100.0%)
Price range: £185 - £185
Price levels: 1 different prices over 47 days
Description
Product Specifications
- Format
- paperback
- ASIN
- 1627080228
- Domain
- Amazon UK
- Release Date
- 30 November 2013
- Listed Since
- 24 April 2014
Barcode
No barcode data available
Similar Products You Might Like
Microelectronic Materials and Processes: 164 (NATO Science Series E:, 164)
Springer
Microelectronic Materials and Processes: 164 (NATO Science Series E:, 164)
Springer
Gettering Defects in Semiconductors: 19 (Springer Series in Advanced Microelectronics, 19)
Springer
Springer - Microelectronic Test Structures for CMOS Technology
Springer
Selected Semiconductor Research by Ming-Fu Li
Imperial College Press
Selected Advances in Nanoelectronic Devices: Logic, Memory and RF: 175 (Lecture Notes in Electrical Engineering, 175)
Springer
Introducing Technology Computer-Aided Design (TCAD): Fundamentals, Simulations, and Applications
Taylor & Francis
Fundamentals Of Nanotransistors: 6 (Lessons from Nanoscience: A Lecture Notes Series)
World Scientific Publishing Company
Microelectronic Packaging (New Trends in Electrochemical Technology)
CRC Press
Mechanics of Microelectronics: 141 (Solid Mechanics and Its Applications, 141)
Springer
Mechanics of Microelectronics: 141 (Solid Mechanics and Its Applications, 141)
Springer
Micro System Technologies 90: 1st International Conference on Micro Electro, Opto, Mechanic Systems and Components Berlin, 10–13 September 1990
Springer
Low-Dimensional Structures in Semiconductors: From Basic Physics to Applications: 281 (NATO Science Series B:, 281)
Springer
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley
Microelectronics Failure Analysis Desk Reference
Handbook of Semiconductor Manufacturing Technology
CRC Press
Electronics: Basic, Analog, and Digital with PSpice
CRC Press
Into The Nano Era: Moore's Law Beyond Planar Silicon CMOS: 106 (Springer Series in Materials Science, 106)
Springer
3D and Circuit Integration of MEMS
Wiley
More than Moore: Creating High Value Micro/Nanoelectronics Systems
Springer
Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis: Proceedings of the 13th European ... (ESREF 2002) Rimini, Italy 7-11 October 2002
Pergamon
Microelectronics Manufacturing Diagnostics Handbook
Springer
Metrology and Diagnostic Techniques for Nanoelectronics
Taylor & Francis
Springer Introduction to VLSI Silicon Devices Textbook
Springer