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Taylor & Francis Metrology and Diagnostic Techniques for Nanoelectronics

Name: Metrology and Diagnostic Techniques for Nanoelectronics
Brand: Taylor & Francis

Technical

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Description

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging―a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Product Specifications

Brand: Taylor & Francis
Format: hardcover
ASIN: 9814745081
Category: Books > Subjects > Reference > Writing > Technical
Domain: Amazon UK
Release Date: 03 October 2016
Listed Since: 24 June 2016

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Taylor & Francis Metrology and Diagnostic Techniques for Nanoelectronics

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