£129.56

Springer Sequential Logic Testing and Verification - Book 163

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Description

Designing and building high-performance computers requires a deep understanding of reliability. This technical volume from the Springer International Series in Engineering and Computer Science addresses how design decisions impact the incidence of failure in complex systems. For engineers working with integrated circuits, understanding the relationship between design rules and manufacturing yield is a necessity. This book explores how to analyze these factors to ensure a higher percentage of functional chips during the manufacturing process. By examining the various aspects of reliability, this text provides the foundational knowledge needed to produce dependable computer hardware and integrated circuits. It serves as a resource for those focused on the intersection of architecture, microprocessors, and circuit design.

Key Features

Explores the relationship between design decisions and the incidence of failure in high-performance computer systems.

Provides analysis on how design rules affect manufacturing yield and the percentage of functional chips obtained.

Focuses on the essential aspects of reliability required to build and sustain high-performance computing architectures.

Part of the Springer International Series in Engineering and Computer Science, volume 163.

Addresses critical reliability issues for engineers designing integrated circuits and microprocessors.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
30 November 1991
Listed Since
16 February 2007

Barcode

No barcode data available

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