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ISTFA 2011: Proceedings from the 37th International Symposium for Testing and Failure Analysis
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Description
<p>This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results. </p>
Product Specifications
- Format
- hardcover
- ASIN
- 1615038264
- Domain
- Amazon UK
- Release Date
- 30 November 2011
- Listed Since
- 06 May 2012
Barcode
No barcode data available
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