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ISTFA 2016 Proceedings from the 42nd International Symposium for Testing and Failure Analysis

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Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, The Next Generation FA Engineer.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
30 October 2016
Listed Since
30 March 2017

Barcode

No barcode data available

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