£145.74

This is the most expensive it has ever been. Walk away.

£146 today · previous high £146 · all-time low £137

Brand: ASM International ISTFA 2021 Conference Proceedings - System-in-Package Technology

Amazon

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 70 days · 70 data points (no recent data)

Historical
Generating forecast…
£145.74 £135.72 £137.91 £140.09 £142.28 £144.46 £146.65 25 July 2026 11 August 2026 28 August 2026 14 September 2026 02 October 2026
View at Amazon ↗

Price data last checked 21 day(s) ago - will refresh soon

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↑ Price chart
when this has been cheap or pricey
↑ Forecast
where the price is heading next
↓ Statistics
all-time high & low, recent range
↑ Price alert
name your number, we'll email you

Price Distribution

Price distribution over 70 days • 3 price levels

Days at Price
Current Price
48 days 11 days 11 days · current 0 12 24 36 48 £137 £138 £146 Days at Price

Price Analysis

Most common price: £137 (48 days, 68.6%)

Price range: £137 - £146

Price levels: 3 different prices over 70 days

Description

The ISTFA 2021 Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis, published by ASM International, delivers comprehensive research on System-in-Package (SiP) technology and advanced failure analysis methods. This collection features peer-reviewed papers covering board and system level failure analysis, counterfeit microelectronics detection, emerging failure analysis techniques, scanning probe analysis, hardware security and reverse engineering, microscopy and material characterization, and nanoprobing with electrical characterization. Engineers, materials scientists and failure analysis professionals will find critical insights into future challenges facing the field, current best practices in electronic testing, and innovative approaches to ensuring component reliability and authenticity in modern electronic systems.

Key Features

ISTFA 2021 proceedings document cutting-edge research on System-in-Package (SiP) technology presented at the 47th International Symposium for Testing and Failure Analysis.

Papers cover board and system level failure analysis techniques essential for identifying defects and improving electronic component reliability.

Includes detailed discussions on detecting counterfeit microelectronics and preventing fraud in the electronic supply chain.

Features research on hardware attacks, security vulnerabilities, and reverse engineering methods for protecting advanced electronic systems.

Comprehensive coverage of scanning probe analysis, microscopy and material characterization for detailed component inspection.

Explores nanoprobing and electrical characterisation techniques that enable precise testing of complex integrated circuits and assemblies.

Product Specifications

Barcode

No barcode data available

Similar Products You Might Like

ISTFA 2009: International Symposium for Testing and Failure Analysis (Book & CD)
97% match

ISTFA 2009: International Symposium for Testing and Failure Analysis (Book & CD)

£110.00 19 Sep 2026
ISTFA 2012: 38th International Symposium Testing Failure Analysis
97% match

ISTFA 2012: 38th International Symposium Testing Failure Analysis

Brand: ASM International

£175.00 01 Oct 2026
ISTFA(TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
96% match

ISTFA(TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

£185.00 18 Sep 2026
ISTFA 2019: Proceedings from the 45th International Symposium for Testing and Failure Analysis
96% match

ISTFA 2019: Proceedings from the 45th International Symposium for Testing and Failure Analysis

£186.00 23 Sep 2026
96% match

ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

£161.00 25 Sep 2026
95% match

ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis

£182.00 12 Sep 2026
Failure Modes and Mechanisms in Electronic Packages
95% match

Failure Modes and Mechanisms in Electronic Packages

Springer

£118.58 30 Sep 2026
Testing of Interposer-Based 2.5D Integrated Circuits
95% match

Testing of Interposer-Based 2.5D Integrated Circuits

Springer

£72.09 22 Sep 2026
Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond
94% match

Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond

CRC Press

£82.74 11 Sep 2026
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications: 5 (Frontiers in Electronic Testing, 5)
94% match

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications: 5 (Frontiers in Electronic Testing, 5)

Springer

£89.99 24 Sep 2026
VLSI-SoC: Advanced Topics on Systems on a Chip: A Selection of Extended Versions of the Best Papers of the Fourteenth International Conference on Very ... and Communication Technology, 291)
94% match

VLSI-SoC: Advanced Topics on Systems on a Chip: A Selection of Extended Versions of the Best Papers of the Fourteenth International Conference on Very ... and Communication Technology, 291)

Springer

£76.42 18 Sep 2026
System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)
94% match

System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon, Volume .)

Elsevier

£51.99 12 Sep 2026
Algorithms for VLSI Physical Design Automation
94% match

Algorithms for VLSI Physical Design Automation

Springer

£94.65 03 Oct 2026
Algorithms for VLSI Physical Design Automation
94% match

Algorithms for VLSI Physical Design Automation

Springer

£103.34 26 Sep 2026
Werkstückbegleitender Informationsspeicher als Basis für ein informationstechnisches Konzept für Halbleiterfertigungen: 149 (IPA-IAO - Forschung und Praxis, 149)
94% match

Werkstückbegleitender Informationsspeicher als Basis für ein informationstechnisches Konzept für Halbleiterfertigungen: 149 (IPA-IAO - Forschung und Praxis, 149)

Springer

£46.99 01 Oct 2026
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits: 46 (Lecture Notes in Electrical Engineering, 46)
94% match

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits: 46 (Lecture Notes in Electrical Engineering, 46)

Springer

£73.35 18 Sep 2026
Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing, 29)
94% match

Introduction to Advanced System-on-Chip Test Design and Optimization: 29 (Frontiers in Electronic Testing, 29)

Springer

£111.99 30 Sep 2026
Direct Transistor-Level Layout for Digital Blocks
94% match

Direct Transistor-Level Layout for Digital Blocks

Springer

£72.87 24 Sep 2026
CTL for Test Information of Digital ICs
94% match

CTL for Test Information of Digital ICs

Springer

£51.21 21 Sep 2026
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
94% match

Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)

Wiley

£98.38 18 Sep 2026
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)
94% match

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits: 17 (Frontiers in Electronic Testing, 17)

Springer

£103.48 18 Sep 2026