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ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

Electronics Engineering

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Description

The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

Product Specifications

Format: paperback
ASIN: 162708150X
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering
Domain: Amazon UK
Release Date: 28 February 2018
Listed Since: 28 September 2017

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ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

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