We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£175.00
Brand: ASM International ASM International ISTFA 2012 - Failure Analysis Proceedings
Price data last checked 55 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£175 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 36 days · 36 data points (no recent data)
Price Distribution
Price distribution over 36 days • 1 price levels
Price Analysis
Most common price: £175 (36 days, 100.0%)
Price range: £175 - £175
Price levels: 1 different prices over 36 days
Description
Key Features
Access the latest research and practical data presented at the 38th International Symposium for Testing and Failure Analysis.
Gain technical knowledge to detect, understand, and eliminate failures in electronic devices and complex systems.
Study detailed case histories and review papers that provide real-world context for failure analysis.
Explore guides to new and unique tools and methodologies used in the microelectronics community.
Review diverse applications and results to improve testing and failure analysis processes.
Product Specifications
- Brand
- Brand: ASM International
- Format
- paperback
- ASIN
- 1615039791
- Domain
- Amazon UK
- Release Date
- 15 February 2011
- Listed Since
- 30 November 2012
Barcode
No barcode data available
Similar Products You Might Like
ISTFA 2009: International Symposium for Testing and Failure Analysis (Book & CD)
ISTFA 2011: Proceedings from the 37th International Symposium for Testing and Failure Analysis
ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
Brand: ASM International
ISTFA(TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
ISTFA 2016 Proceedings from the 42nd International Symposium for Testing and Failure Analysis
ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Brand: ASM International
ISTFA 2019: Proceedings from the 45th International Symposium for Testing and Failure Analysis
ASM International ISTFA 2021 - Conference Proceedings
Brand: ASM International
ISTFA 2008: International Symposium for Testing and Failure Analysis (Book & CD)
ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis
ISTFA 2010: Processing of the 36th International Symposium for Testing and Failure Analysis
Electronic Failure Analysis Handbook
McGraw-Hill Education
IEEE International Test Conference 2001
Price unavailable
Handbook of Case Histories in Failure Analysis: v. 2: Volume Two
Failure Analysis of Engineering Structures: Methodology and Case Histories
Brand: ASM International
ISTFA 2013: Proceedings from the 39th International Symposium for Testing and Failure Analysis
Microelectronics Failure Analysis Desk Reference
Integrated Circuit Failure Analysis: A Guide to Preparation Techniques (Quality and Reliability Engineering Series)
Wiley
Wiley-IEEE Press Digital Systems Testing and Testable Design
Wiley-IEEE Press
Fehlerbaumanalyse in Theorie und Praxis: Grundlagen und Anwendung der Methode
Springer
Springer Design for AT-Speed Test, Diagnosis and Measurement
Springer
Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
Springer
Reliability Prediction for Microelectronics (Quality and Reliability Engineering Series)
Wiley