We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£52.40
It has never been this cheap. We have no record of a lower price.
£52 today · cheaper than every other day in the last 3 months
Springer Metal Impurities in Silicon-Device Fabrication: 24 (Springer Series in Materials Science, 24)
47 figures, 36 tables
Price data last checked 12 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 79 days · 79 data points (no recent data)
47 figures, 36 tables
Price data last checked 12 day(s) ago - will refresh soon
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 79 days • 3 price levels
Price Analysis
Most common price: £55 (65 days, 82.3%)
Price range: £52 - £55
Price levels: 3 different prices over 79 days
Description
Key Features
Used Book in Good Condition
Product Specifications
- Brand
- Springer
- Model
- 47 figures, 36 tables
- Format
- hardcover
- ASIN
- 3540642137
- Domain
- Amazon UK
- Publication Date
- 18 February 2000
- Listed Since
- 10 December 2006
Barcode
No barcode data available
Similar Products You Might Like
Metal Impurities in Silicon-Device Fabrication: 24 (Springer Series in Materials Science, 24)
Springer
Predictive Simulation of Semiconductor Processing: Status and Challenges: 72 (Springer Series in Materials Science, 72)
Springer
Semiconductor Research Experimental Techniques - Springer Series 150
Springer
Purification Process and Characterization of Ultra High Purity Metals: Application of Basic Science to Metallurgical Processing (Springer Series in Materials Processing)
Springer
Materials for Information Technology: Devices, Interconnects and Packaging (Engineering Materials and Processes)
Springer
Crucial Issues in Semiconductor Materials and Processing Technologies: (Closed)): 222 (NATO Science Series E:)
Springer
Proceedings of the 25th International Conference on the Physics of Semiconductors Part I: Osaka, Japan, September 17–22, 2000: 87 (Springer Proceedings in Physics, 87)
Springer
Organosilicon Materials: 3 / 3H (The Handbook of Environmental Chemistry, 3 / 3H)
Springer
Technology of Integrated Circuits Vol 2 - Springer Series Advanced Microelectronics
Springer
Springer Materials Processing Fundamentals 2018 Textbook
Springer
Materials for Information Technology: Devices, Interconnects and Packaging (Engineering Materials and Processes)
Springer
Semiconductor Surfaces and Interfaces: 26 (Springer Series in Surface Sciences, 26)
Springer
Proceedings of the 2013 International Symposium on Liquid Metal Processing and Casting (The Minerals, Metals & Materials Series)
Springer
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Springer
Semiconductors: New Data and Updates for IIa-VI Compounds with Mg and Sr (Structural Properties, Thermal and Thermodynamic Properties, and Lattice ... in Science and Technology - New Series, 44H)
Springer
Chemical-Mechanical Planarization of Semiconductor Materials: 69 (Springer Series in Materials Science, 69)
Springer
Semimagnetic Semiconductors and Diluted Magnetic Semiconductors: International Proceedings: Vol 55 (Ettore Majorana International Science Series / Physical Sciences)
Springer
Handbook of Silicon Semiconductor Metrology
CRC Press
Impurities in Semiconductors: Solubility, Migration and Interactions
CRC Press
More-than-Moore 2.5D and 3D SiP Integration
Springer
Impurity Scattering in Metallic Alloys (Physics of Solids and Liquids)
Springer
Handbook of Silicon Semiconductor Metrology
CRC Press
Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications: 85 (Springer Series in Materials Science, 85)
Springer
Springer Lifetime Spectroscopy Silicon Defect Characterization
Springer