We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£215.00
CRC Press Impurities in Semiconductors: Solubility, Migration and Interactions
Price data last checked 148 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 8 months ago.
£215 today · all-time low £205 (Sep 2025) · usually the usual
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 583 days • 583 data points (No recent data available)
Price Distribution
Price distribution over 583 days • 5 price levels
Price Analysis
Most common price: £205 (341 days, 58.5%)
Price range: £205 - £218
Price levels: 5 different prices over 583 days
Description
Product Specifications
- Brand
- CRC Press
- Format
- Hardcover
- ASIN
- 0415308313
- Domain
- Amazon UK
- Release Date
- 27 January 2004
- Listed Since
- 09 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Electronic Properties of Doped Semiconductors: 45 (Springer Series in Solid-State Sciences, 45)
Springer
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Springer
Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)
Advances in Infrared Photodetectors: 84 (Semiconductors and Semimetals): Volume 84
Academic Press
Extended Defects in Semiconductors: Electronic Properties, Device Effects And Structures
Cambridge University Press
Photo-induced Defects Semiconductrs: 4 (Cambridge Studies in Semiconductor Physics and Microelectronic Engineering, Series Number 4)
Cambridge University Press
D(X) Centres and other Metastable Defects in Semiconductors, Proceedings of the INT Symposium, Mauterndorf, Austria, 18-22 February 1991: Proceedings ... Mauterndorf, Austria, 18-22 February 1991
CRC Press
Semiconductor Materials: An Introduction to Basic Principles (Microdevices)
Springer
Fundamentals of Semiconductors: Physics and Materials Properties (Graduate Texts in Physics)
Springer
Polycrystalline Semiconductors: Physical Properties and Applications: Proceedings of the International School of Materials Science and Technology at ... (Springer Series in Solid-State Sciences, 57)
Springer
Crucial Issues in Semiconductor Materials and Processing Technologies: (Closed)): 222 (NATO Science Series E:)
Springer
Comprehensive Semiconductor Science and Technology, Six-Volume Set: 1-6
Elsevier
Gettering Defects in Semiconductors: 19 (Springer Series in Advanced Microelectronics, 19)
Springer
Dopants and Defects in Semiconductors
CRC Press
Gallium-Nitride (GaN) II (Volume 57) (Semiconductors and Semimetals, Volume 57)
Academic Press
Semiconductors and Semimetals: Biomolecular Systems: Volume 83 (Semiconductors and Semimetals, Volume 83)
Academic Press
Fundamentals of Semiconductor Materials and Devices
Wiley
Dopants and Defects in Semiconductors
CRC Press
New Developments in Semiconductor Research
Brand: Nova Science Pub Inc
Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164
CRC Press
Trends in Semiconductor Research
New Research on Semiconductors - Nova Science Publishers Inc
Physics of Semiconductor Devices
Springer
Crucial Issues in Semiconductor Materials and Processing Technologies: NATO Asi : Series E : Applied Sciences, Vol. 222 (NATO Science Series E:, 222)
Springer