£36.43

Leading-Edge Semiconductor Research - Nova Science Publishers

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£62.80 £23.66 £32.20 £40.74 £49.28 £57.82 £66.36 28 April 2026 18 May 2026 08 June 2026 29 June 2026 20 July 2026

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6 days 10 days 19 days 15 days · current 6 days 10 days 9 days 9 days 0 5 10 14 19 £27 £32 £34 £36 £37 £50 £60 £63 Days at Price

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Most common price: £34 (19 days, 22.6%)

Price range: £27 - £63

Price levels: 8 different prices over 84 days

Description

Expand your technical knowledge with Leading-Edge Semiconductor Research. This comprehensive volume provides an in-depth look at the fundamental properties of semiconductors, covering bulk, low-dimensional, and amorphous materials. It is an essential resource for understanding the structural, electrical, optical, and acoustical characteristics that define modern semiconductor science. Readers will find detailed analysis on computational semiconductor physics and the complex interface properties of heterojunctions, metal-semiconductor junctions, and insulator-semiconductor junctions. The text also explores multi-layered structures and the science of dopant incorporation. Beyond theoretical physics, this book addresses the practical side of material science. It covers growth and preparation techniques, including epitaxial methods such as molecular beam and chemical vapour methods, as well as bulk techniques. With information on in situ monitoring of epitaxial growth processes, this book serves as a vital reference for engineers and researchers working in electronics and communications engineering.

Key Features

Covers structural, electrical, optical, and acoustical properties of bulk, low-dimensional, and amorphous semiconductors.

Provides detailed studies on computational semiconductor physics and interface properties including heterojunctions.

Explores the physics and chemistry of metal-semiconductor and insulator-semiconductor junctions.

Includes analysis of multi-layered structures involving various semiconductor components.

Details material growth and preparation through epitaxial methods like molecular beam and chemical vapour techniques.

Discusses dopant incorporation and in situ monitoring of epitaxial growth processes.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
18 July 2005
Listed Since
05 February 2007

Barcode

No barcode data available

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