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£169.99
Springer Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications: 85 (Springer Series in Materials Science, 85)
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Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3642064531
- Domain
- Amazon UK
- Release Date
- 19 October 2010
- Listed Since
- 01 October 2010
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