£73.74

Imperial College Press X-ray Scattering From Semiconductors (2nd Edition) - Imperial College

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Description

Gain a deep understanding of material analysis with X-ray Scattering From Semiconductors (2nd Edition). Published by Imperial College Press, this book serves as a practical guide for researchers and students working with complex materials. It provides a thorough description of underlying theories and addresses the instrumental aberrations often encountered during real experiments. The text focuses heavily on the analysis of thin films and multilayers, with a primary concentration on semiconductors. Because semiconductors can function as highly perfect composite crystals, this book explains how X-ray scattering techniques can be used to assess deviations from perfection. This capability allows for the collection of a large volume of detailed information regarding material structure. Designed with a conceptual approach, the writing helps readers grasp the real principles behind the science. Whether you are studying physical chemistry or advanced material science, this edition offers the technical foundation needed to navigate the complexities of X-ray scattering and its applications in semiconductor research.

Key Features

Provides a practical guide to the analysis of various materials through detailed X-ray scattering techniques.

Covers essential underlying theories and explains instrumental aberrations caused by real-world experimental conditions.

Focuses on the analysis of thin films and multilayers, making it ideal for semiconductor research.

Explains how to use X-ray scattering to assess deviations from perfection in composite crystals.

Uses a conceptual description style to help readers grasp fundamental scientific principles easily.

Delivers high volumes of information regarding the study of semiconductor structures and properties.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
08 July 2003
Listed Since
05 February 2007

Barcode

No barcode data available

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