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Imperial College Press - X-ray Scattering From Semiconductors

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£74.75 £71.91 £72.53 £73.15 £73.77 £74.39 £75.01 20 July 2026 08 August 2026 28 August 2026 16 September 2026 06 October 2026
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Price range: £72 - £75

Price levels: 4 different prices over 79 days

Description

X-ray Scattering From Semiconductors (2nd Edition) provides a practical guide to material analysis. Published by Imperial College Press, this text offers a thorough description of underlying theories and the instrumental aberrations that occur during real experiments. The content focuses on the analysis of thin films and multilayers, with a primary emphasis on semiconductors. Because semiconductors can function as perfect composite crystals, this book explains how X-ray scattering can assess deviations from perfection to provide a large volume of information. The description is written with a conceptual approach, helping readers grasp the real principles of the field through a clear and accessible lens.

Key Features

This 2nd Edition book by Imperial College Press serves as a practical guide for the analysis of various materials.

The text provides a detailed description of underlying theories and instrumental aberrations found in real experiments.

Content focuses on the analysis of thin films and multilayers, specifically regarding semiconductor applications.

Learn how X-ray scattering can assess deviations from perfection in semiconductor composite crystals.

The conceptual description helps readers grasp real principles related to semiconductor material study.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
08 July 2003
Listed Since
05 February 2007

Barcode

No barcode data available

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