X-Ray Absorption Spectroscopy of Semiconductors: 190 (Springer Series in Optical Sciences, 190) - Image 1

£78.42

Springer X-Ray Absorption Spectroscopy of Semiconductors: 190 (Springer Series in Optical Sciences, 190)

Name: X-Ray Absorption Spectroscopy of Semiconductors: 190 (Springer Series in Optical Sciences, 190)
Brand: Springer
Price: 78.42 GBP
Availability: InStock

99 black & white illustrations, 86 colou

Analytical Chemistry

It has never been this cheap. We have no record of a lower price.

£78 today · cheaper than every other day in the last 3 months

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 1 days • 1 data points (No recent data available)

Historical

Generating forecast...

Not enough data points to display chart (need at least 2 points)

Price Distribution

Price distribution over 1 days • 1 price levels

Days at Price

Price Analysis

Most common price: £78 (1 days, 100.0%)

Price range: £78 - £78

Price levels: 1 different prices over 1 days

Description

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

Product Specifications

Brand: Springer
Model: 99 black & white illustrations, 86 colou
Format: hardcover
ASIN: 3662443619
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Analytical Chemistry
Domain: Amazon UK
Release Date: 17 November 2014
Listed Since: 03 July 2014

Barcode

No barcode data available

Springer X-Ray Absorption Spectroscopy of Semiconductors: 190 (Springer Series in Optical Sciences, 190)

It has never been this cheap. We have no record of a lower price.

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Springer Optical Properties of Semiconductors Textbook

X-ray Scattering from Semiconductors

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK: 107 (Springer Proceedings in Physics, 107)

Advances in Infrared Photodetectors: 84 (Semiconductors and Semimetals): Volume 84

Springer Inelastic Light Scattering of Semiconductor Nanostructures

Light Scattering in Semiconductor Structures and Superlattices: 273 (NATO Science Series B:, 273)

X-Ray Metrology in Semiconductor Manufacturing

Optical Absorption of Impurities and Defects in Semiconducting Crystals: Electronic Absorption of Deep Centres and Vibrational Spectra: 169 (Springer Series in Solid-State Sciences, 169)

Advanced Optical Spectroscopy Techniques for Semiconductors: Raman, Infrared, and Cathodoluminescence Spectroscopy

Semiconductors and Electronic Materials (Progress in Photothermal & Photoacoustic Science & Technology) (Press Monographs)

Springer X-Ray Diffuse Scattering Mesoscopic Structures 199

Basic Semiconductor Physics (Graduate Texts in Physics)

Identification of Defects in Semiconductors (Volume 51B) (Semiconductors and Semimetals, Volume 51B)

Spectroscopy of Complex Oxide Interfaces: Photoemission and Related Spectroscopies: 266 (Springer Series in Materials Science, 266)

Electron & Molecular Phenomena on the Surface of Semiconductors (Physics Research and Technology)

Physics of Semiconductors 2002: Proceedings of the 26th International Conference, Edinburgh, 29 July to 2 August 2002: 1 (Institute of Physics Conference Series)

Wiley Electronic Materials Science - Advanced Science Textbook

Semiconductor Physics: Principles, Theory and Nanoscale: 3 (Electroscience Series)

Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK: 164

The Physics of Semiconductors: An Introduction Including Nanophysics and Applications (Graduate Texts in Physics)

Fundamentals of Semiconductor Materials and Devices

Photo-induced Defects Semiconductrs: 4 (Cambridge Studies in Semiconductor Physics and Microelectronic Engineering, Series Number 4)

X-ray Scattering From Semiconductors And Other Materials (3rd Edition)

Gallium-Nitride (GaN) II (Volume 57) (Semiconductors and Semimetals, Volume 57)