£121.23

Springer X-Ray Diffuse Scattering Mesoscopic Structures 199

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Description

This monograph from Springer provides a detailed survey of X-ray diffuse scattering and its role in the structural characterization of mesoscopic material systems. Covering length scales from a few to several hundred nanometers, this text is a vital resource for researchers studying semiconductor layer systems. Readers will find a comprehensive overview of the current state-of-the-art theory regarding X-ray diffuse scattering. The content is specifically relevant to those investigating interface roughness or low-dimensional objects, such as quantum dots and quantum wires. This volume serves as a technical guide for understanding how these mesoscopic structures behave and can be analyzed through advanced X-ray methods.

Key Features

Covers the mesoscopic regime ranging from a few to hundreds of nanometers in length scale.

Provides a critical survey of X-ray diffuse scattering capabilities for material characterization.

Offers an extensive overview of state-of-the-art theory for mesoscopic structures.

Focuses on semiconductor layer systems and interface roughness analysis.

Includes detailed information on low-dimensional objects like quantum dots and quantum wires.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
09 January 2004
Listed Since
22 December 2006

Barcode

No barcode data available

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