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£118.19
Springer X-Ray Diffuse Scattering Mesoscopic Structures 199
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Description
Key Features
Covers the mesoscopic regime ranging from a few to hundreds of nanometers in length scale.
Provides a critical survey of X-ray diffuse scattering capabilities for material characterization.
Offers an extensive overview of state-of-the-art theory for mesoscopic structures.
Focuses on semiconductor layer systems and interface roughness analysis.
Includes detailed information on low-dimensional objects like quantum dots and quantum wires.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3540201793
- Domain
- Amazon UK
- Release Date
- 09 January 2004
- Listed Since
- 22 December 2006
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