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Springer X-Ray Diffuse Scattering Semiconductor Monograph

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£120.35 £85.51 £93.11 £100.71 £108.32 £115.92 £123.52 27 July 2026 12 August 2026 29 August 2026 14 September 2026 01 October 2026
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1 day · current 4 days 31 days 31 days 0 8 16 23 31 £89 £111 £118 £120 Days at Price

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Description

This Springer monograph provides a critical survey of X-ray diffuse scattering capabilities for the structural characterization of mesoscopic material systems. Part of the Springer Tracts in Modern Physics series (Volume 199), the text focuses on the mesoscopic regime, covering length scales from a few up to several hundred nanometers. The content is highly relevant for semiconductor layer systems, specifically addressing interface roughness and low-dimensional objects like quantum dots and quantum wires. Readers receive an extensive overview of the current state-of-the-art theory regarding X-ray diffuse scattering at mesoscopic structures, making it a necessary resource for those studying advanced semiconductor materials and electromagnetic theory.

Key Features

This Springer monograph covers X-ray diffuse scattering for structural characterization of mesoscopic material systems.

The text explores the mesoscopic regime involving length scales ranging from a few to hundreds of nanometers.

It provides detailed information on semiconductor layer systems, including interface roughness analysis.

The book addresses low-dimensional objects such as quantum dots and quantum wires.

Readers can access an extensive overview of state-of-the-art theory for X-ray diffuse scattering at mesoscopic structures.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
09 January 2004
Listed Since
22 December 2006

Barcode

No barcode data available

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