Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269) - Image 1

£94.25

Springer Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)

Name: Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)
Brand: Springer
Price: 91.52 GBP
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Analytical Chemistry

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Product Description The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown. From the Back Cover The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown. About the Author Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan. Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.

Product Specifications

Brand: Springer
Format: Paperback
ASIN: 3662571226
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Analytical Chemistry
Domain: Amazon UK
Release Date: 07 July 2018
Listed Since: 09 July 2018

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Springer Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)

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