High Resolution X-Ray Diffractometry And Topography - Image 1

£59.49

CRC Press High Resolution X-Ray Diffractometry And Topography

Name: High Resolution X-Ray Diffractometry And Topography
Brand: CRC Press
Price: 60.71 GBP
Availability: InStock

Chemistry

Price History & Forecast

Last 30 days • 30 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 30 days • 2 price levels

Days at Price

Current Price

Price Analysis

Most common price: £59 (19 days, 63.3%)

Price range: £59 - £61

Price levels: 2 different prices over 30 days

Description

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

Product Specifications

Brand: CRC Press
Format: paperback
ASIN: 0367400634
Category: Books > Subjects > Science, Nature & Maths > Chemistry
Domain: Amazon UK
Release Date: 20 December 2019
Listed Since: 08 August 2019

Barcode

No barcode data available

CRC Press High Resolution X-Ray Diffractometry And Topography

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

High Resolution X-Ray Diffractometry And Topography

X-Ray Diffraction for Materials Research: From Fundamentals to Applications

X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)

X-Ray Diffraction Imaging: Technology and Applications (Devices, Circuits, and Systems)

X-Ray Diffraction for Materials Research: From Fundamentals to Applications

X-ray and Electron Diffraction Studies in Materials Science (Matsci)

X-Ray Metrology in Semiconductor Manufacturing

Industrial Applications of X-Ray Diffraction

Materials Characterization Techniques

X-Ray Photoelectron Spectroscopy of Solid Surfaces

Electronic Structure Crystallography and Functional Motifs of Materials

High-Z Materials for X-ray Detection: Material Properties and Characterization Techniques

Advanced X-ray Imaging of Electrochemical Energy Materials and Devices

X-ray Scattering from Semiconductors

Two-dimensional X-ray Diffraction

X-Ray Diffraction Procedures: For Polycrystalline and Amorphous Materials (Wiley-Interscience Publication)

Introduction to X-Ray Powder Diffractometry: 158 (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)

X-Ray Fluorescence Spectrometry and Related Techniques: An Introduction (AGENCY/DISTRIBUTED)

Semiconductor Radiation Detectors: Technology and Applications (Devices, Circuits, and Systems)

X-Ray Scattering (Materials Science and Technologies) Book

CRC Press - Optical Techniques for Solid-State Materials

Crystals, X-rays and Proteins: Comprehensive Protein Crystallography

Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183)