Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183) - Image 1

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Springer Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183)

Name: Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183)
Brand: Springer

71 black & white illustrations, 37 colou

Physical Chemistry

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This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Product Specifications

Brand: Springer
Model: 71 black & white illustrations, 37 colou
Format: hardcover
ASIN: 3642381766
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Physical Chemistry
Domain: Amazon UK
Release Date: 18 September 2013
Listed Since: 04 April 2013

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Springer Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science, 183)

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