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X-Ray Scattering: Materials Science and Technologies Book

Amazon

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Description

Explore the fundamental principles and modern research of X-ray scattering techniques in this specialized volume. This book covers non-destructive analytical methods used to reveal crystallographic structure, chemical composition, and physical properties of materials and thin films. Readers will gain insights into how scattered intensity is observed as a function of incident and scattered angle, polarization, and wavelength or energy. The text includes current research updates, such as real-time synchrotron X-ray scattering and specific applications in edible lipid systems. It serves as a technical resource for those studying materials science and advanced analytical technologies.

Key Features

Covers non-destructive analytical techniques for studying crystallographic structure and chemical composition.

Provides detailed information on the physical properties of materials and thin films.

Includes research on real-time synchrotron X-ray scattering methods.

Discusses practical applications of X-ray scattering in edible lipid systems.

Explains how scattered intensity relates to incident and scattered angle, polarization, and energy.

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