£124.19

X-Ray Scattering (Materials Science and Technologies) Book

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Description

Explore the fundamental principles and modern applications of X-ray scattering in this comprehensive scientific text. This book provides a detailed look at non-destructive analytical techniques used to reveal the crystallographic structure, chemical composition, and physical properties of various materials and thin films. Readers will gain insights into how these techniques function by observing scattered intensity as a function of incident and scattered angle, polarization, and wavelength or energy. The content covers current research developments, including real-time synchrotron X-ray scattering. It also explores practical applications, such as the use of X-ray scattering in edible lipid systems. This resource is designed for professionals and researchers in materials science and engineering looking to understand the mechanics and practical uses of X-ray technology.

Key Features

Covers non-destructive analytical techniques for studying crystallographic structures and chemical compositions of materials.

Provides detailed information on analyzing thin films through scattered intensity observations.

Explains the relationship between scattered intensity and variables like angle, polarization, and wavelength.

Includes research on real-time synchrotron X-ray scattering for advanced material study.

Discusses practical applications of these techniques in specialized fields like edible lipid systems.

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