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£174.99

CRC Press High Resolution X-Ray Diffractometry And Topography

Name: High Resolution X-Ray Diffractometry And Topography
Brand: CRC Press
Price: 174.99 GBP
Availability: InStock

Chemistry

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Description

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

Product Specifications

Brand: CRC Press
Format: hardcover
ASIN: 0850667585
Category: Books > Subjects > Science, Nature & Maths > Chemistry
Domain: Amazon UK
Release Date: 05 February 1998
Listed Since: 05 January 2007

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CRC Press High Resolution X-Ray Diffractometry And Topography

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