£172.27

Springer Diffraction Analysis of Microstructure of Materials 68

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Description

Understanding the microstructure of materials is a fundamental requirement for developing and assessing engineering materials for practical use. This technical text from the Springer Series in Materials Science provides a comprehensive overview of diffraction methods used to analyze these structures. Because crystallite size and lattice defects directly influence material properties, having accurate information about these characteristics is essential for researchers and engineers. This book focuses on the most effective and non-destructive evaluation techniques available today, specifically X-ray and neutron diffraction. It provides detailed technical information on critical topics such as diffraction-line broadening. By mastering these methods, professionals can better evaluate the microstructural integrity of materials, ensuring they meet the necessary standards for various engineering applications.

Key Features

Provides an overview of diffraction methods used to analyze the microstructure of various materials.

Covers non-destructive evaluation techniques, including X-ray and neutron diffraction methods.

Explains how crystallite size and lattice defects influence the properties of engineering materials.

Includes detailed technical information regarding diffraction-line broadening processes.

Part of the Springer Series in Materials Science, volume 68, for specialized technical reference.

Product Specifications

Format
Hardcover
Domain
Amazon UK
Release Date
26 November 2003
Listed Since
27 December 2006

Barcode

No barcode data available

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